Works matching IS 2199160X AND DT 2016 AND VI 2 AND IP 10
1
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600224
- Han, Zhuo;
- Zhan, Ke;
- Wang, Xianying;
- Zheng, Guangping;
- Yang, Junhe
- Article
2
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201670055
- Wang, Xuefeng;
- Pan, Xingchen;
- Gao, Ming;
- Yu, Jihai;
- Jiang, Juan;
- Zhang, Junran;
- Zuo, Huakun;
- Zhang, Minhao;
- Wei, Zhongxia;
- Niu, Wei;
- Xia, Zhengcai;
- Wan, Xiangang;
- Chen, Yulin;
- Song, Fengqi;
- Xu, Yongbing;
- Wang, Baigeng;
- Wang, Guanghou;
- Zhang, Rong
- Article
3
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600228
- Wang, Xuefeng;
- Pan, Xingchen;
- Gao, Ming;
- Yu, Jihai;
- Jiang, Juan;
- Zhang, Junran;
- Zuo, Huakun;
- Zhang, Minhao;
- Wei, Zhongxia;
- Niu, Wei;
- Xia, Zhengcai;
- Wan, Xiangang;
- Chen, Yulin;
- Song, Fengqi;
- Xu, Yongbing;
- Wang, Baigeng;
- Wang, Guanghou;
- Zhang, Rong
- Article
4
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201670057
- Article
5
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201670056
- Article
6
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201670058
- Matsuhisa, Naoji;
- Sakamoto, Hiroaki;
- Yokota, Tomoyuki;
- Zalar, Peter;
- Reuveny, Amir;
- Lee, Sunghoon;
- Someya, Takao
- Article
7
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600219
- Yan, Yinuo;
- Wan, Caihua;
- Zhou, Xiangjun;
- Shi, Guoyi;
- Cui, Bin;
- Han, Jiahao;
- Fan, Yihong;
- Han, Xiufeng;
- Wang, Kang L.;
- Pan, Feng;
- Song, Cheng
- Article
8
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201670054
- Cho, Yuljae;
- Ahn, Docheon;
- Park, Jong Bae;
- Pak, Sangyeon;
- Lee, Sanghyo;
- Jun, Byoung Ok;
- Hong, John;
- Lee, Su Yong;
- Jang, Jae Eun;
- Hong, Jinpyo;
- Morris, Stephen M.;
- Sohn, Jung Inn;
- Cha, Seung Nam;
- Kim, Jong Min
- Article
9
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600330
- Martella, Christian;
- Melloni, Pierpaolo;
- Cinquanta, Eugenio;
- Cianci, Elena;
- Alia, Mario;
- Longo, Massimo;
- Lamperti, Alessio;
- Vangelista, Silvia;
- Fanciulli, Marco;
- Molle, Alessandro
- Article
10
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600326
- Yoon, Kyung Jean;
- Bae, Woorham;
- Jeong, Deog‐Kyoon;
- Hwang, Cheol Seong
- Article
11
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600273
- Knobelspies, Stefan;
- Daus, Alwin;
- Cantarella, Giuseppe;
- Petti, Luisa;
- Münzenrieder, Niko;
- Tröster, Gerhard;
- Salvatore, Giovanni Antonio
- Article
12
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600267
- Lu, Guanghao;
- Pietro, Riccardo Di;
- Kölln, Lisa Sophie;
- Nasrallah, Iyad;
- Zhou, Ling;
- Mollinger, Sonya;
- Himmelberger, Scott;
- Koch, Norbert;
- Salleo, Alberto;
- Neher, Dieter
- Article
13
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600259
- Matsuhisa, Naoji;
- Sakamoto, Hiroaki;
- Yokota, Tomoyuki;
- Zalar, Peter;
- Reuveny, Amir;
- Lee, Sunghoon;
- Someya, Takao
- Article
14
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600248
- Chen, Zhizhong;
- Wang, Yiping;
- Shi, Yuhan;
- Hsu, Bo;
- Yang, Zheng;
- Shi, Jian
- Article
15
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600233
- Shin, Keun‐Young;
- Kim, Youngjin;
- Antolinez, Felipe V.;
- Ha, Jeong Sook;
- Lee, Sang‐Soo;
- Park, Jong Hyuk
- Article
16
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600225
- Cho, Yuljae;
- Ahn, Docheon;
- Park, Jong Bae;
- Pak, Sangyeon;
- Lee, Sanghyo;
- Jun, Byoung Ok;
- Hong, John;
- Lee, Su Yong;
- Jang, Jae Eun;
- Hong, Jinpyo;
- Morris, Stephen M.;
- Sohn, Jung Inn;
- Cha, Seung Nam;
- Kim, Jong Min
- Article
17
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600215
- Ji, Deyang;
- Jersch, Johann;
- Fuchs, Harald
- Article
18
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600204
- Pingel, Patrick;
- Arvind, Malavika;
- Kölln, Lisa;
- Steyrleuthner, Robert;
- Kraffert, Felix;
- Behrends, Jan;
- Janietz, Silvia;
- Neher, Dieter
- Article
19
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600203
- Goetz, Katelyn P.;
- Tsutsumi, Jun'ya;
- Pookpanratana, Sujitra;
- Chen, Jihua;
- Corbin, Nathan S.;
- Behera, Rakesh K.;
- Coropceanu, Veaceslav;
- Richter, Curt A.;
- Hacker, Christina A.;
- Hasegawa, Tatsuo;
- Jurchescu, Oana D.
- Article
20
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600185
- Nayak, Pranati;
- Kurra, Narendra;
- Xia, Chuan;
- Alshareef, Husam N.
- Article
21
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600161
- De Keukeleere, Katrien;
- Cayado, Pablo;
- Meledin, Alexander;
- Vallès, Ferran;
- De Roo, Jonathan;
- Rijckaert, Hannes;
- Pollefeyt, Glenn;
- Bruneel, Els;
- Palau, Anna;
- Coll, Mariona;
- Ricart, Susagna;
- Van Tendeloo, Gustaaf;
- Puig, Teresa;
- Obradors, Xavier;
- Van Driessche, Isabel
- Article
22
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600152
- Lorenz‐Rothe, Melanie;
- Schellhammer, Karl Sebastian;
- Jägeler‐Hoheisel, Till;
- Meerheim, Rico;
- Kraner, Stefan;
- Hein, Moritz P.;
- Schünemann, Christoph;
- Tietze, Max L.;
- Hummert, Markus;
- Ortmann, Frank;
- Cuniberti, Gianaurelio;
- Körner, Christian;
- Leo, Karl
- Article
23
- Advanced Electronic Materials, 2016, v. 2, n. 10, p. 1, doi. 10.1002/aelm.201600112
- Ma, Li;
- Zhou, Heng‐An;
- Wang, Lei;
- Fan, Xiao‐Long;
- Fan, Wei‐Jia;
- Xue, De‐Sheng;
- Xia, Ke;
- Wang, Zhe;
- Wu, Ru‐Qian;
- Guo, Guang‐Yu;
- Sun, Li;
- Wang, Xiao;
- Cheng, Xue‐Mei;
- Zhou, Shi‐Ming
- Article