Works matching IS 20799292 AND DT 2023 AND VI 12 AND IP 12


Results: 203
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    Survey of Reliability Research on 3D Packaged Memory.

    Published in:
    Electronics (2079-9292), 2023, v. 12, n. 12, p. 2709, doi. 10.3390/electronics12122709
    By:
    • Zhou, Shuai;
    • Ma, Kaixue;
    • Wu, Yugong;
    • Liu, Peng;
    • Hu, Xianghong;
    • Nie, Guojian;
    • Ren, Yan;
    • Qiu, Baojun;
    • Cai, Nian;
    • Xu, Shaoqiu;
    • Wang, Han
    Publication type:
    Article
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