Works matching IS 20505698 AND DT 2023 AND VI 72 AND IP 5
Results: 13
In This Issue.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 1, doi. 10.1093/jmicro/dfad047
- Publication type:
- Article
Correction to: High-resolution and analytical electron microscopy in a liquid flow cell via gas purging.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 460, doi. 10.1093/jmicro/dfad033
- Publication type:
- Article
Recent advances in in-resin correlative light and electron microscopy of Epon-embedded cells.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 383, doi. 10.1093/jmicro/dfad028
- By:
- Publication type:
- Article
Semiautomatic contour tracking method for biological object segmentation in thin-section electron microscope images with modified zero DC component–type Gabor wavelets.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 433, doi. 10.1093/jmicro/dfad018
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- Publication type:
- Article
Measurement and correction of TEM image distortion using arbitrary samples.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 425, doi. 10.1093/jmicro/dfad015
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- Publication type:
- Article
Edge effect of wide spectrum denoising in super-resolution microscopy.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 418, doi. 10.1093/jmicro/dfad012
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- Publication type:
- Article
Super-resolution method for SEM images based on pixelwise weighted loss function.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 408, doi. 10.1093/jmicro/dfad009
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- Publication type:
- Article
A specific technique of immunolabelling of urinary small extracellular vesicle biomarkers for the diagnostic of renal cancer.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 450, doi. 10.1093/jmicro/dfad007
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- Publication type:
- Article
Development of temporal series 4D-STEM and application to relaxation time measurement.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 446, doi. 10.1093/jmicro/dfad006
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- Publication type:
- Article
Time-resolved electron holography and its application to an ionic liquid specimen.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 455, doi. 10.1093/jmicro/dfad003
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- Publication type:
- Article
Low-aberration ExB deflector optics for scanning electron microscopy.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 399, doi. 10.1093/jmicro/dfad001
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- Publication type:
- Article
Analyzing the synchronism of stacking-fault formation in side-by-side SiC nanowire pairs using the Levenshtein distance: stochastic versus deterministic processes.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 395, doi. 10.1093/jmicro/dfac073
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- Publication type:
- Article
Observations of nemaline bodies in muscle biopsies of critically ill patients infected with SARS-CoV-2.
- Published in:
- Microscopy, 2023, v. 72, n. 5, p. 388, doi. 10.1093/jmicro/dfac072
- By:
- Publication type:
- Article