Works matching IS 20474938 AND DT 2024
1
- IET Biometrics (Wiley-Blackwell), 2024, p. 1, doi. 10.1049/2024/7408331
- Li, Min;
- Jiang, Xue;
- Zhu, Honghao;
- Liu, Fei;
- Wang, Huabin;
- Tao, Liang;
- Liu, Shijun;
- Conti, Vincenzo
- Article
2
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/7886911
- Santemiz, Pinar;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N. J.;
- Vielhauer, Claus
- Article
3
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/6630173
- Yuan, Chengsheng;
- Xu, Zhenyu;
- Li, Xinting;
- Zhou, Zhili;
- Huang, Junhao;
- Guo, Ping;
- Rathgeb, Christian
- Article
4
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/6663315
- Kawai, Hiroya;
- Ito, Koichi;
- Chen, Hwann-Tzong;
- Aoki, Takafumi;
- Wan, Jun
- Article
5
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/bme2/5576927
- Gao, Anqi;
- Zhong, Yantao;
- Kanagasundaram, Ahilan
- Article
6
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/bme2/7095412
- An, Byeong Seon;
- Lim, Hyeji;
- Seong, Hyeon Ah;
- Lee, Eui Chul;
- Wan, Jun
- Article
7
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/5873909
- Chen, Guang;
- Luo, Dacan;
- Lian, Fengzhao;
- Tian, Feng;
- Yang, Xu;
- Kang, Wenxiong;
- Srinivas, M.
- Article
8
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/5683547
- Wu, Yihang;
- Hu, Junlin;
- Conti, Vincenzo
- Article
9
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/4982277
- Zhang, Wei;
- Yu, Guibo;
- Deng, Shijie;
- Conti, Vincenzo
- Article
10
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/2280143
- She, Huimin;
- Hu, Yongjian;
- Liu, Beibei;
- Li, Chang-Tsun;
- Conti, Vincenzo
- Article
11
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/5351588
- Qi, Hengnian;
- Zeng, Gang;
- Jia, Keke;
- Zhang, Chu;
- Wu, Xiaoping;
- Li, Mengxia;
- Lang, Qing;
- Wang, Lingxuan;
- Kanagasundaram, Ahilan
- Article
12
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/3236602
- Arıcan, Tuğçe;
- Veldhuis, Raymond;
- Spreeuwers, Luuk;
- Bergeron, Loïc;
- Busch, Christoph;
- Jalilian, Ehsaneddin;
- Kauba, Christof;
- Kirchgasser, Simon;
- Marcel, Sébastien;
- Prommegger, Bernhard;
- Raja, Kiran;
- Ramachandra, Raghavendra;
- Uhl, Andreas
- Article
13
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/6694481
- Li, Xiao;
- Chen, Xiao;
- Fu, Rui;
- Hu, Xiao;
- Chen, Mintong;
- Niu, Kun
- Article
14
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/1808587
- Kolberg, Jascha;
- Schäfer, Yannik;
- Rathgeb, Christian;
- Busch, Christoph
- Article
15
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/6523854
- Zhao, Yi;
- Jin, Xin;
- Gao, Song;
- Wu, Liwen;
- Yao, Shaowen;
- Jiang, Qian
- Article
16
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/4413655
- Normakristagaluh, Pesigrihastamadya;
- Laanstra, Geert J.;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N. J.
- Article
17
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/8526857
- Yáñez, Claudio;
- Tapia, Juan E.;
- Perez, Claudio A.;
- Busch, Christoph
- Article
18
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/4924184
- Dai, Fen;
- Wang, Ziyang;
- Zou, Xiangqun;
- Zhang, Rongwen;
- Deng, Xiaoling
- Article