Works matching IS 20474938 AND DT 2018 AND VI 7 AND IP 4
1
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 285, doi. 10.1049/iet-bmt.2018.0014
- Article
2
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 287, doi. 10.1049/iet-bmt.2017.0151
- Jia, Ning;
- Sanchez, Victor;
- Li, Chang‐Tsun
- Article
3
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 296, doi. 10.1049/iet-bmt.2017.0148
- Almaghtuf, Jumma;
- Khelifi, Fouad
- Article
4
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 325, doi. 10.1049/iet-bmt.2017.0147
- Neubert, Tom;
- Makrushin, Andrey;
- Hildebrandt, Mario;
- Kraetzer, Christian;
- Dittmann, Jana
- Article
5
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 314, doi. 10.1049/iet-bmt.2017.0146
- Söllinger, Dominik;
- Trung, Pauline;
- Uhl, Andreas
- Article
6
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 305, doi. 10.1049/iet-bmt.2017.0145
- Juarez‐Sandoval, Oswaldo;
- Fragoso‐Navarro, Eduardo;
- Cedillo‐Hernandez, Manuel;
- Cedillo‐Hernandez, Antonio;
- Nakano, Mariko;
- Perez‐Meana, Hector
- Article
7
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 333, doi. 10.1049/iet-bmt.2017.0144
- Gomez‐Barrero, Marta;
- Rathgeb, Christian;
- Scherhag, Ulrich;
- Busch, Christoph
- Article
8
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 342, doi. 10.1049/iet-bmt.2017.0142
- Suppiah, Ravi;
- Vinod, Achutavarrier Prasad
- Article
9
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 349, doi. 10.1049/iet-bmt.2017.0078
- Article
10
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 365, doi. 10.1049/iet-bmt.2016.0198
- Andavar, Suruliandi;
- Elango, Poongothai
- Article
11
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 371, doi. 10.1049/iet-bmt.2016.0178
- Neves, João;
- Moreno, Juan;
- Proença, Hugo
- Article
12
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 356, doi. 10.1049/iet-bmt.2016.0125
- Rathgeb, Christian;
- Buchmann, Nicolas;
- Hofbauer, Heinz;
- Baier, Harald;
- Uhl, Andreas;
- Busch, Christoph
- Article
13
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 4, p. 380, doi. 10.1049/iet-bmt.2016.0092
- Ayyavoo, Thamizharasi;
- John Suseela, Jayasudha
- Article