Works matching IS 20474938 AND DT 2015 AND VI 4 AND IP 4
1
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 206, doi. 10.1049/iet-bmt.2015.0100
- Poh, Norman;
- Schuckers, Michael
- Article
2
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 191, doi. 10.1049/iet-bmt.2015.0070
- Article
3
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 209, doi. 10.1049/iet-bmt.2015.0061
- Article
4
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 200, doi. 10.1049/iet-bmt.2015.0043
- Grother, Patrick;
- Matey, James R.;
- Quinn, George W.
- Article
5
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 236, doi. 10.1049/iet-bmt.2014.0107
- Poh, Norman;
- Kittler, Josef;
- Chan, Chi‐Ho;
- Pandit, Medha
- Article
6
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 227, doi. 10.1049/iet-bmt.2014.0073
- Wild, Peter;
- Ferryman, James;
- Uhl, Andreas
- Article
7
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 220, doi. 10.1049/iet-bmt.2014.0070
- Bours, Patrick;
- Mondal, Soumik
- Article
8
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 4, p. 192, doi. 10.1049/iet-bmt.2014.0007
- Bowyer, Kevin W.;
- Ortiz, Estefan
- Article