Works matching IS 20474938 AND DT 2014 AND VI 3 AND IP 2
1
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 45, doi. 10.1049/iet-bmt.2014.0023
- Correia, Paulo Lobato;
- Soares, Luís Ducla
- Article
2
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 47, doi. 10.1049/iet-bmt.2013.0090
- Lynnerup, Niels;
- Larsen, Peter Kastmand
- Article
3
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 62, doi. 10.1049/iet-bmt.2013.0076
- Štruc, Vitomir;
- Žganec‐Gros, Jerneja;
- Vesnicer, Boštjan;
- Pavešić, Nikola
- Article
4
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 94, doi. 10.1049/iet-bmt.2013.0067
- Wang, Ruifang;
- Ramos, Daniel;
- Veldhuis, Raymond;
- Fierrez, Julian;
- Spreeuwers, Luuk;
- Xu, Haiyun
- Article
5
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 84, doi. 10.1049/iet-bmt.2013.0062
- Guan, Yu;
- Sun, Yunlian;
- Li, Chang‐Tsun;
- Tistarelli, Massimo
- Article
6
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 101, doi. 10.1049/iet-bmt.2013.0057
- Qian, Kun;
- Schott, Maik;
- Zheng, Wenju;
- Dittmann, Jana
- Article
7
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 75, doi. 10.1049/iet-bmt.2013.0056
- Kotropoulos, Constantine L.
- Article
8
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 55, doi. 10.1049/iet-bmt.2013.0054
- Bustard, John D.;
- Carter, John N.;
- Nixon, Mark S.;
- Hadid, Abdenour
- Article