Works matching IS 18276660 AND DT 2006 AND VI 1 AND IP 5
1
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 719
- Article
2
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 663
- Article
3
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 704
- Skander-Mustapha, S.;
- Slama-Belkhodja, I.
- Article
4
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 695
- Belfedal, C.;
- Moreau, S.;
- Champenois, G.;
- Allaoui, T.;
- Denai, M.
- Article
5
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 684
- Kosonen, A.;
- Jokinen, M.;
- Ahola, J.;
- Niemelä, M.
- Article
6
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 619
- Article
7
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 711
- Ali, M. H.;
- Murata, T.;
- Tamura, J.
- Article
8
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 654
- Lewicki, A.;
- Krzeminski, Z.;
- Zosiuk, B.
- Article
9
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 646
- Gombert, C.;
- Ocnasu, D.;
- Bacha, S.;
- Roye, D.;
- Bésanger, Y.
- Article
10
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 633
- Smida, M. Ben;
- Ammar, F. Ben
- Article
11
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 670
- Nogueiras, A. A.;
- Lago, A.;
- Álvarez, L. J.;
- López, O.;
- Doval, J.;
- Marcos, J.;
- Martínez-Peñalver, C.
- Article
12
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 613
- Takala, M.;
- Salovaara, P.;
- Keikko, T.;
- Kannus, K.
- Article
13
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 609
- Article
14
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 603
- Article
15
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 594
- Mimouni, A.;
- Azzouz, Z.;
- Harraz, O.;
- Guemri, B.;
- Cherifi, A.
- Article
16
- International Review of Electrical Engineering, 2006, v. 1, n. 5, p. 582
- Pham, C. D.;
- Raison, B.;
- Rognon, J.-P.
- Article