Works matching IS 17518822 AND DT 2024 AND VI 18 AND IP 9
1
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 598, doi. 10.1049/smt2.12226
- Wang, Ruimiao;
- Fan, Xiaowei;
- Yang, Haifeng;
- Dong, Guangde;
- Yang, Yi;
- Wang, Jingang
- Article
2
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 578, doi. 10.1049/smt2.12223
- Besharatifard, Hamidreza;
- Hasanzadeh, Saeed
- Article
3
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 564, doi. 10.1049/smt2.12222
- Wang, Yonghong;
- Ge, Xingyu;
- Zhuang, Yu;
- Meng, Zihe;
- Zhao, Chunming
- Article
4
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 453, doi. 10.1049/smt2.12221
- Article
5
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 556, doi. 10.1049/smt2.12218
- Huang, Xing;
- Hua, Guoxiang;
- Li, Weiwei;
- Yan, Jiyuan
- Article
6
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 547, doi. 10.1049/smt2.12217
- Lu, Hailiang;
- Wang, Wei;
- Zhang, Yirui;
- Shao, Keren;
- Wu, Wenhua;
- Zhang, Hu;
- Yuan, Tian;
- Li, Chun;
- Wen, Xishan;
- Lan, Lei
- Article
7
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 495, doi. 10.1049/smt2.12209
- Mohammadzaheri, Morteza;
- Tafreshi, Reza;
- Bazghaleh, Mohsen;
- Grainger, Steven;
- Khorasani, Mohammad
- Article
8
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 522, doi. 10.1049/smt2.12213
- Lee, Chun‐Yao;
- Zhuo, Guang‐Lin
- Article
9
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 657, doi. 10.1049/smt2.12212
- Baldan, Marco;
- Di Barba, Paolo
- Article
10
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 512, doi. 10.1049/smt2.12211
- Naeimi, Tohid;
- Ahmadi, Arash
- Article
11
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 503, doi. 10.1049/smt2.12210
- Kalantarnia, Ali;
- Rajabi, Siavash;
- Mirzabeigi, Abdollah
- Article
12
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 534, doi. 10.1049/smt2.12214
- Hung, Chun‐Chun;
- Wang, Meng‐Hui;
- Lu, Shiue‐Der;
- Kuo, Cheng‐Chien
- Article
13
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 481, doi. 10.1049/smt2.12208
- Safaei, Faridoddin;
- Niasati, Mohsen
- Article
14
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 649, doi. 10.1049/smt2.12206
- Baranski, Mariusz;
- Demenko, Andrzej;
- Szelag, Wojciech;
- Lyskawinski, Wieslaw
- Article
15
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 471, doi. 10.1049/smt2.12204
- Xu, Zhiniu;
- Wu, Xiaonan;
- Liu, Yuxuan;
- Zhao, Lina;
- Zhao, Lijuan;
- Song, Shipeng;
- Cui, Ruilei
- Article
16
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 455, doi. 10.1049/smt2.12198
- Zhu, Bing;
- Li, Jingshu;
- Cui, Guoheng;
- Li, Zuohu;
- Tian, Ge;
- Guo, Xia
- Article
17
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 641, doi. 10.1049/smt2.12197
- Ragusa, Antonella;
- Wouters, Peter A. A. F.;
- Sasse, Hugh;
- Duffy, Alistair;
- Rachidi, Farhad;
- Rubinstein, Marcos
- Article
18
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 629, doi. 10.1049/smt2.12196
- Le Boudec, Elias;
- Karami, Hamidreza;
- Mora, Nicolas;
- Rachidi, Farhad;
- Rubinstein, Marcos;
- Vega, Felix
- Article
19
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 620, doi. 10.1049/smt2.12190
- Ziegler, Anna;
- Hahn, Robert;
- Isensee, Victoria;
- Nguyen, Anh Duc;
- Schöps, Sebastian
- Article
20
- IET Science, Measurement & Technology (Wiley-Blackwell), 2024, v. 18, n. 9, p. 613, doi. 10.1049/smt2.12185
- Knypiński, Łukasz;
- Devarapalli, Ramesh;
- Gillon, Frederic
- Article
