Works matching IS 16717449 AND DT 2025 AND VI 39 AND IP 1
1
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 104, doi. 10.62756/csjs.1671-7449.2025015
- Article
2
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 96, doi. 10.62756/csjs.1671-7449.2025014
- Article
3
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 88, doi. 10.62756/csjs.1671-7449.2025013
- Article
4
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 81, doi. 10.62756/csjs.1671-7449.2025012
- Article
5
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 72, doi. 10.62756/csjs.1671-7449.2025011
- Article
6
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 63, doi. 10.62756/csjs.1671-7449.2025010
- Article
7
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 54, doi. 10.62756/csjs.1671-7449.2025009
- Article
8
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 46, doi. 10.62756/csjs.1671-7449.2025008
- Article
9
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 41, doi. 10.62756/csjs.1671-7449.2025007
- Article
10
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 33, doi. 10.62756/csjs.1671-7449.2025006
- Article
11
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 27, doi. 10.62756/csjs.1671-7449.2025005
- 罗后明;
- 雷 程;
- 李锐锐;
- 张 姝;
- 赵佳龙;
- 肖楚译;
- 王旦旦
- Article
12
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 13, doi. 10.62756/csjs.1671-7449.2025003
- 刘雨桥;
- 张 姝;
- 雷 程;
- 余建刚;
- 唐梦璇;
- 王涛龙;
- 梁 庭
- Article
13
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 1, doi. 10.62756/csjs.1671-7449.2025001
- Article
14
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 20, doi. 10.62756/csjs.1671-7449.2025004
- Article
15
- Journal of Test & Measurement Technology, 2025, v. 39, n. 1, p. 7, doi. 10.62756/csjs.1671-7449.2025002
- Article