Works matching IS 16717449 AND DT 2024 AND VI 38 AND IP 6
1
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 686, doi. 10.3969/j.issn.1671-7449.2024086
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2
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 678, doi. 10.3969/j.issn.1671-7449.2024081
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3
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 695, doi. 10.3969/j.issn.1671-7449.2024085
- Article
4
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 668, doi. 10.3969/j.issn.1671-7449.2024083
- Article
5
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 601, doi. 10.3969/j.issn.1671-7449.2024075
- 陈建云;
- 张 奇;
- 姬煜琦;
- 王 子;
- 李佳林;
- 李汝鹏;
- 李鹏程;
- 田 威
- Article
6
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 635, doi. 10.3969/j.issn.1671-7449.2024078
- Article
7
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 618, doi. 10.3969/j.issn.1671-7449.2024080
- 李子博;
- 陈小龙;
- 欧阳吉庭;
- 缪劲松;
- 张 宇;
- 王若珏;
- 高志良
- Article
8
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 661, doi. 10.3969/j.issn.1671-7449.2024082
- Article
9
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 652, doi. 10.3969/j.issn.1671-7449.2024077
- Article
10
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 642, doi. 10.3969/j.issn.1671-7449.2024076
- Article
11
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 610, doi. 10.3969/j.issn.1671-7449.2024079
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12
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 627, doi. 10.3969/j.issn.1671-7449.2024084
- Article
13
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 593, doi. 10.3969/j.issn.1671-7449.2024087
- 杨 晶;
- 王 晨;
- 赵 峻;
- 刘洪涛;
- 安国文;
- 贾平岗;
- 张樱子
- Article
14
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 586, doi. 10.3969/j.issn.1671-7449.2024067
- Article
15
- Journal of Test & Measurement Technology, 2024, v. 38, n. 6, p. 575, doi. 10.3969/j.issn.1671-7449.2024067
- Article