Works matching IS 1671-4598 AND VI 32 AND IP 4 AND DT 2024
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 135, doi. 10.16526/j.cnki.11-4762/tp.2024.04.020
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 94, doi. 10.16526/j.cnki.11-4762/tp.2024.04.014
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 46, doi. 10.16526/j.cnki.11-4762/tp.2024,04,007
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 334, doi. 10.16526/j.cnki.11-4762/tp.2024.04.047
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 67, doi. 10.16526/j.cnki.11-4762/tp.2024.04.010
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 210, doi. 10.16526/j.cnki.11-4762/tp.2024.04.030
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 264, doi. 10.16526/j.cnki.11-4762/tp.2024.04.037
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 188, doi. 10.16526/j.cnki.11-4762/tp.2024.04.027
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 61, doi. 10.16526/j.cnki.11-4762/tp.2024.04.009
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 241, doi. 10.16526/j.cnki.11-4762/tp.2024.04.034
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 106, doi. 10.16526/j.cnki.11-4762/tp.2024.04.016
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 87, doi. 10.16526/j.cnki.11-4762/tp.2024.04.013
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 322, doi. 10.16526/j.cnki.11-4762/tp.2024.04.045
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 257, doi. 10.16526/j.cnki.11-4762/tp.2024.04.036
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 100, doi. 10.16526/j.cnki.11-4762/tp.2024.04.015
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 1, doi. 10.16526/j.cnki.11-4762/tp.2024.04.001
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 201, doi. 10.16526/j.cnki.11-4762/tp.2024.04.029
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 166, doi. 10.16526/j.cnki.11-4762/tp.2024.04.024
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 219, doi. 10.16526/j.cnki.11-4762/tp.2024.04.031
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 271, doi. 10.16526/j.cnki.11-4762/tp.2024.04.038
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 300, doi. 10.16526/j.cnki.11-4762/tp.2024.04.042
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 308, doi. 10.16526/j.cnki.11-4762/tp.2024.04.043
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 143, doi. 10.16526/j.cnki.11-4762/tp.2024.04.021
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 287, doi. 10.16526/j.cnki.11-4762/tp.2024.04.040
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 29, doi. 10.16526/j.cnki.11-4762/tp.2024.04.005
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 22, doi. 10.16526/j.cnki.11-4762/tp.2024.04.004
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 195, doi. 10.16526/j.cnki.11-4762/tp.2024.04.028
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 15, doi. 10.16526/j.cnki.11-4762/tp.2024.04.003
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 74, doi. 10.16526/j.cnki.11-4762/tp.2024.04.011中
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 293, doi. 10.16526/j.cnki.11-4762/tp.2024.04.041
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 54, doi. 10.16526/j.cnki.11-4762/tp.2024.04.008
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 81, doi. 10.16526/j.cnki.11-4762/tp.2024.04.012中图分类
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 314, doi. 10.16526/j.cnki.11-4762/tp.2024.04.044
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 226, doi. 10.16526/j.cnki.11-4762/tp.2024.04.032
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 37, doi. 10.16526/j.cnki.11-4762/tp.2024.04.006
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 248, doi. 10.16526/j.cnki.11-4762/tp.2024.04.035
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 279, doi. 10.16526/j.cnki.11-4762/tp.2024.04.039
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 113, doi. 10.16526/j.cnki.11-4762/tp.2024.04.017
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 180, doi. 10.16526/j.cnki.11-4762/tp.2024.04.026
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 8, doi. 10.16526/j.cnki.11-4762/tp.2024.04.002
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 151, doi. 10.16526/j.cnki.11-4762/tp.2024.04.022
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 159, doi. 10.16526/j.cnki.11-4762/tp.2024.04.023
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 232, doi. 10.16526/j.cnki.11-4762/tp.2024.04.033
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 174, doi. 10.16526/j.cnki.11-4762/tp.2024.04.025
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 328, doi. 10.16526/j.cnki.11-4762/tp.2024.04.046
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 120, doi. 10.16526/j.cnki.11-4762/tp.2024.04.018
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- Computer Measurement & Control, 2024, v. 32, n. 4, p. 129, doi. 10.16526/j.cnki.11-4762/tp.2024.04.019
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