Works in Computer Measurement & Control, 2017, Vol 25, Issue 12
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 307, doi. 10.16526/j.cnki.11-4762/tp.2017.12.079
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 302, doi. 10.16526/j.cnki.11-4762/tp.2017.12.078
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 298, doi. 10.16526/j.cnki.11-4762/tp.2017.12.077
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 295, doi. 10.16526/j.cnki.11-4762/tp.2017.12.076
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 291, doi. 10.16526/j.cnki.11-4762/tp.2017.12.075
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 288, doi. 10.16526/j.cnki.11-4762/tp.2017.12.074
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 283, doi. 10.16526/j.cnki.11-4762/tp.2017.12.073
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 279, doi. 10.16526/j.cnki.11-4762/tp.2017.12.072
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 275, doi. 10.16526/j.cnki.11-4762/tp.2017.12.071
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 271, doi. 10.16526/j.cnki.11-4762/tp.2017.12.070
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 267, doi. 10.16526/j.cnki.11-4762/tp.2017.12.069
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 263, doi. 10.16526/j.cnki.11-4762/tp.2017.12.068
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 259, doi. 10.16526/j.cnki.11-4762/tp.2017.12.067
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 255, doi. 10.16526/j.cnki.11-4762/tp.2017.12.066
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 251, doi. 10.16526/j.cnki.11-4762/tp.2017.12.065
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 247, doi. 10.16526/j.cnki.11-4762/tp.2017.12.064
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 243, doi. 10.16526/j.cnki.11-4762/tp.2017.12.063
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 240, doi. 10.16526/j.cnki.11-4762/tp.2017.12.062
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 237, doi. 10.16526/j.cnki.11-4762/tp.2017.12.061
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 232, doi. 10.16526/j.cnki.11-4762/tp.2017.12.060
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 228, doi. 10.16526/j.cnki.11-4762/tp.2017.12.059
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 224, doi. 10.16526/j.cnki.11-4762/tp.2017.12.058
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 219, doi. 10.16526/j.cnki.11-4762/tp.2017.12.057
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 215, doi. 10.16526/j.cnki.11-4762/tp.2017.12.056
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 211, doi. 10.16526/j.cnki.11-4762/tp.2017.12.055
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 207, doi. 10.16526/j.cnki.11-4762/tp.2017.12.054
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 203, doi. 10.16526/j.cnki.11-4762/tp.2017.12.053
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 199, doi. 10.16526/j.cnki.11-4762/tp.2017.12.052
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 195, doi. 10.16526/j.cnki.11-4762/tp.2017.12.051
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 191, doi. 10.16526/j.cnki.11-4762/tp.2017.12.050
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 187, doi. 10.16526/j.cnki.11-4762/tp.2017.12.049
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 184, doi. 10.16526/j.cnki.11-4762/tp.2017.12.048
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 180, doi. 10.16526/j.cnki.11-4762/tp.2017.12.047
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 177, doi. 10.16526/j.cnki.11-4762/tp.2017.12.046
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 150, doi. 10.16526/j.cnki.11-4762/tp.2017.12.039
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 172, doi. 10.16526/j.cnki.11-4762/tp.2017.12.045
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 166, doi. 10.16526/j.cnki.11-4762/tp.2017.12.043
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 162, doi. 10.16526/j.cnki.11-4762/tp.2017.12.042
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 158, doi. 10.16526/j.cnki.11-4762/tp.2017.12.041
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 153, doi. 10.16526/j.cnki.11-4762/tp.2017.12.040
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 170, doi. 10.16526/j.cnki.11-4762/tp.2017.12.044
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 146, doi. 10.16526/j.cnki.11-4762/tp.2017.12.038
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 141, doi. 10.16526/j.cnki.11-4762/tp.2017.12.037
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 137, doi. 10.16526/j.cnki.11-4762/tp.2017.12.036
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 133, doi. 10.16526/j.cnki.11-4762/tp.2017.12.035
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 129, doi. 10.16526/j.cnki.11-4762/tp.2017.12.034
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 125, doi. 10.16526/j.cnki.11-4762/tp.2017.12.033
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 120, doi. 10.16526/j.cnki.11-4762/tp.2017.12.032
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 117, doi. 10.16526/j.cnki.11-4762/tp.2017.12.031
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- Computer Measurement & Control, 2017, v. 25, n. 12, p. 114, doi. 10.16526/j.cnki.11-4762/tp.2017.12.030
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