Works in Computer Measurement & Control, 2017, Vol 25, Issue 11
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 311, doi. 10.16526/j.cnki.11-4762/tp.2017.11.079
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 307, doi. 10.16526/j.cnki.11-4762/tp.2017.11.078
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 303, doi. 10.16526/j.cnki.11-4762/tp.2017.11.077
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 299, doi. 10.16526/j.cnki.11-4762/tp.2017.11.076
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 295, doi. 10.16526/j.cnki.11-4762/tp.2017.11.075
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 291, doi. 10.16526/j.cnki.11-4762/tp.2017.11.074
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 288, doi. 10.16526/j.cnki.11-4762/tp.2017.11.073
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 284, doi. 10.16526/j.cnki.11-4762/tp.2017.11.072
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 280, doi. 10.16526/j.cnki.11-4762/tp.2017.11.071
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 276, doi. 10.16526/j.cnki.11-4762/tp.2017.11.070
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 273, doi. 10.16526/j.cnki.11-4762/tp.2017.11.069
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 269, doi. 10.16526/j.cnki.11-4762/tp.2017.11.068
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 265, doi. 10.16526/j.cnki.11-4762/tp.2017.11.067
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 262, doi. 10.16526/j.cnki.11-4762/tp.2017.11.066
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 257, doi. 10.16526/j.cnki.11-4762/tp.2017.11.065
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 252, doi. 10.16526/j.cnki.11-4762/tp.2017.11.064
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 248, doi. 10.16526/j.cnki.11-4762/tp.2017.11.063
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 244, doi. 10.16526/j.cnki.11-4762/tp.2017.11.062
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 239, doi. 10.16526/j.cnki.11-4762/tp.2017.11.061
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 234, doi. 10.16526/j.cnki.11-4762/tp.2017.11.060
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 230, doi. 10.16526/j.cnki.11-4762/tp.2017.11.059
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 227, doi. 10.16526/j.cnki.11-4762/tp.2017.11.058
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 223, doi. 10.16526/j.cnki.11-4762/tp.2017.11.057
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 220, doi. 10.16526/j.cnki.11-4762/tp.2017.11.056
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 216, doi. 10.16526/j.cnki.11-4762/tp.2017.11.055
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 212, doi. 10.16526/j.cnki.11-4762/tp.2017.11.054
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 208, doi. 10.16526/j.cnki.11-4762/tp.2017.11.053
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 205, doi. 10.16526/j.cnki.11-4762/tp.2017.11.052
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 201, doi. 10.16526/j.cnki.11-4762/tp.2017.11.051
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 197, doi. 10.16526/j.cnki.11-4762/tp.2017.11.050
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 193, doi. 10.16526/j.cnki.11-4762/tp.2017.11.049
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 190, doi. 10.16526/j.cnki.11-4762/tp.2017.11.048
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 186, doi. 10.16526/j.cnki.11-4762/tp.2017.11.047
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 183, doi. 10.16526/j.cnki.11-4762/tp.2017.11.046
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 179, doi. 10.16526/j.cnki.11-4762/tp.2017.11.045
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 174, doi. 10.16526/j.cnki.11-4762/tp.2017.11.044
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 170, doi. 10.16526/j.cnki.11-4762/tp.2017.11.043
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 166, doi. 10.16526/j.cnki.11-4762/tp.2017.11.042
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 163, doi. 10.16526/j.cnki.11-4762/tp.2017.11.041
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 159, doi. 10.16526/j.cnki.11-4762/tp.2017.11.040
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 154, doi. 10.16526/j.cnki.11-4762/tp.2017.11.039
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 150, doi. 10.16526/j.cnki.11-4762/tp.2017.11.038
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 146, doi. 10.16526/j.cnki.11-4762/tp.2017.11.037
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 141, doi. 10.16526/j.cnki.11-4762/tp.2017.11.036
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 137, doi. 10.16526/j.cnki.11-4762/tp.2017.11.035
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 133, doi. 10.16526/j.cnki.11-4762/tp.2017.11.034
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 129, doi. 10.16526/j.cnki.11-4762/tp.2017.11.033
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 123, doi. 10.16526/j.cnki.11-4762/tp.2017.11.032
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 120, doi. 10.16526/j.cnki.11-4762/tp.2017.11.031
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- Computer Measurement & Control, 2017, v. 25, n. 11, p. 115, doi. 10.16526/j.cnki.11-4762/tp.2017.11.030
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