Works in Journal of Tiangong University, 2024, Vol 43, Issue 3


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    基于RT-YOLO-V5 的芯片外观缺陷检测.

    Published in:
    Journal of Tiangong University, 2024, v. 43, n. 3, p. 50, doi. 10.3969/j.issn.1671-024x.2024.03.007
    By:
    • 郭翠娟;
    • 王妍;
    • 刘净月;
    • 席雨;
    • 徐伟;
    • 王坦
    Publication type:
    Article
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