Works matching IS 16334760 AND DT 2008 AND VI 31
1
- EAS Publications Series, 2008, v. 31, p. 173, doi. 10.1051/eas:0831034
- Emprechtinger, M.;
- Wiedner, M. C.;
- Simon, R.;
- Wieching, G.;
- Volgenau, N. H.;
- Graf, U. U.;
- Güsten, R.;
- Honingh, C. E.;
- Jacobs, K.;
- Stutzki, J.;
- Wyrowski, F.
- Article
2
- EAS Publications Series, 2008, v. 31, p. 199, doi. 10.1051/eas:0831045
- Nemala, H. B.;
- Porter, R. L.;
- Ferland, G. J.
- Article
3
- EAS Publications Series, 2008, v. 31, p. 189, doi. 10.1051/eas:0831040
- Mühle, S.;
- Seaquist, E. R.;
- Henkel, C.
- Article
4
- EAS Publications Series, 2008, v. 31, p. 183, doi. 10.1051/eas:0831038
- Loenen, A. F.;
- Spaans, M.;
- Baan, W. A.;
- Meijerink, R.
- Article
5
- EAS Publications Series, 2008, v. 31, p. 215, doi. 10.1051/eas:0831051
- Wiedner, M. C.;
- Bielau, F.;
- Emprechtinger, M.;
- Ricken, O.;
- Volgenau, N.;
- Wieching, G.;
- Graf, U. U.;
- Honingh, C. E.;
- Jacobs, K.;
- Stutzki, J.
- Article
6
- EAS Publications Series, 2008, v. 31, p. 213, doi. 10.1051/eas:0831050
- van Hoof, P. A. M.;
- Abel, N. P.;
- Williams, R. J. R.;
- Porter, R.;
- Ferland, G. J.
- Article
7
- EAS Publications Series, 2008, v. 31, p. 211, doi. 10.1051/eas:0831049
- Tosaki, T.;
- Miura, R.;
- Sawada, T.;
- Kuno, N.;
- Nakanishi, K.;
- Kohno, K.;
- Okumura, S. K.;
- Komugi, S.;
- Tamura, Y.;
- Kawabe, R.
- Article
8
- EAS Publications Series, 2008, v. 31, p. 209, doi. 10.1051/eas:0831048
- Sun, K.;
- Kramer, C.;
- Ungerechts, H.;
- Ossenkopf, V.;
- Müller, H.;
- Mookerjea, B.;
- Röllig, M.;
- Stutzki, J.
- Article
9
- EAS Publications Series, 2008, v. 31, p. 101, doi. 10.1051/eas:0831021
- Onishi, T.;
- Kawamura, A.;
- Minamidani, T.;
- Mizuno, Y.;
- Mizuno, N.;
- Mizuno, A.;
- Fukui, Y.
- Article
10
- EAS Publications Series, 2008, v. 31, p. 205, doi. 10.1051/eas:0831047
- Simon, R.;
- Schneider, N.;
- Kramer, C.;
- Ossenkopf, V.;
- Röllig, M.
- Article
11
- EAS Publications Series, 2008, v. 31, p. 201, doi. 10.1051/eas:0831046
- Schulz, A.;
- Muders, D.;
- Henkel, C.
- Article
12
- EAS Publications Series, 2008, v. 31, p. 111, doi. 10.1051/eas:0831023
- Baan, W. A.;
- Henkel, C.;
- Loenen, E.
- Article
13
- EAS Publications Series, 2008, v. 31, p. 197, doi. 10.1051/eas:0831044
- Pineda, J. L.;
- Mizuno, N.;
- Stutzki, J.;
- Cubick, M.
- Article
14
- EAS Publications Series, 2008, v. 31, p. 195, doi. 10.1051/eas:0831043
- Pérez-Beaupuits, J. P.;
- Aalto, S.;
- Spaans, M.;
- dan der Tak, F.
- Article
15
- EAS Publications Series, 2008, v. 31, p. 193, doi. 10.1051/eas:0831042
- Ossenkopf, V.;
- Gerin, M.;
- Güsten, R.;
- Benz, A.;
- Berne, O.;
- Boulanger, F.;
- Bruderer, S.;
- France, K.;
- Fuente, A.;
- Goicoechea, J.;
- Harris, A.;
- Joblin, C.;
- Klein, T.;
- Lord, S.;
- Kramer, C.;
- Martin, P.;
- Martin-Pintado, J.;
- Mookerjea, B.;
- Neufeld, D.;
- Le Petit, F.
- Article
16
- EAS Publications Series, 2008, v. 31, p. 191, doi. 10.1051/eas:0831041
- Okada, Y.;
- Onaka, T.;
- Miyata, T.;
- Okamoto, Y. K.;
- Sakon, I.;
- Shibai, H.;
- Takahashi, H.;
- Kawada, M.;
- Murakami, N.;
- Nakagawa, T.;
- Ootsubo, T.;
- Yasuda, A.
- Article
17
- EAS Publications Series, 2008, v. 31, p. 105, doi. 10.1051/eas:0831022
- Van der Tak, F.;
- Aalto, S.;
- Meijerink, R.
- Article
18
- EAS Publications Series, 2008, v. 31, p. 187, doi. 10.1051/eas:0831039
- Minier, V.;
- André, Ph.;
- Rodriguez, L.;
- Le Pennec, J.;
- Talvard, M.;
- Gallais, P.;
- Revéret, V.;
- Miller, M.
- Article
19
- EAS Publications Series, 2008, v. 31, p. 181, doi. 10.1051/eas:0831037
- Kaneda, H.;
- Suzuki, T.;
- Haze, K.;
- Okada, Y.;
- Onaka, T.;
- Sakon, I.
- Article
20
- EAS Publications Series, 2008, v. 31, p. 177, doi. 10.1051/eas:0831035
- Hitschfeld, M.;
- Aravena, M.;
- Kramer, C.;
- Bertoldi, F.;
- Stutzki, J.
- Article
21
- EAS Publications Series, 2008, v. 31, p. 179, doi. 10.1051/eas:0831036
- Juvela, M.;
- Goncalves, J.;
- Pelkonen, V.-M.;
- Lunttila, T.
- Article
22
- EAS Publications Series, 2008, v. 31, p. 159, doi. 10.1051/eas:0831031
- Hailey-Dunsheath, S.;
- Nikola, T.;
- Oberst, T.;
- Parshley, S.;
- Stacey, G. J.;
- Farrah, D.;
- Benford, D. J.;
- Staguhn, J.
- Article
23
- EAS Publications Series, 2008, v. 31, p. 137, doi. 10.1051/eas:0831027
- Article
24
- EAS Publications Series, 2008, v. 31, p. 169, doi. 10.1051/eas:0831033
- Bayet, E.;
- Berné, O.;
- Joblin, C.;
- Gerin, M.;
- García-Burillo, S.;
- Fuente, A.
- Article
25
- EAS Publications Series, 2008, v. 31, p. 165, doi. 10.1051/eas:0831032
- Bayet, E.;
- Viti, S.;
- Williams, D. A.;
- Rawlings, J. M. C.
- Article
26
- EAS Publications Series, 2008, v. 31, p. 155, doi. 10.1051/eas:0831030
- Nikola, T.;
- Stacey, G.;
- Hailey-Dunsheath, S.;
- Oberst, T.;
- Parshley, S.;
- Benford, D.;
- Staguhn, J.
- Article
27
- EAS Publications Series, 2008, v. 31, p. 151, doi. 10.1051/eas:0831029
- Stacey, G. J.;
- Hailey-Dunsheath, S.;
- Nikola, T.;
- Oberst, T. E.;
- Parshley, S. C.;
- Bradford, C. M.
- Article
28
- EAS Publications Series, 2008, v. 31, p. 97, doi. 10.1051/eas:0831020
- Article
29
- EAS Publications Series, 2008, v. 31, p. 143, doi. 10.1051/eas:0831028
- Article
30
- EAS Publications Series, 2008, v. 31, p. 93, doi. 10.1051/eas:0831019
- Article
31
- EAS Publications Series, 2008, v. 31, p. 129, doi. 10.1051/eas:0831026
- Article
32
- EAS Publications Series, 2008, v. 31, p. 123, doi. 10.1051/eas:0831025
- Article
33
- EAS Publications Series, 2008, v. 31, p. 117, doi. 10.1051/eas:0831024
- Usero, A.;
- García-Burillo, S.;
- Martín-Pintado, J.;
- Fuente, A.;
- Neri, R.
- Article
34
- EAS Publications Series, 2008, v. 31, p. 89, doi. 10.1051/eas:0831018
- Article
35
- EAS Publications Series, 2008, v. 31, p. 85, doi. 10.1051/eas:0831017
- García-Burillo, S.;
- Gracía-Carpio, J.;
- Usero, A.;
- Planesas, P.;
- Fuente, A.;
- Krips, M.
- Article
36
- EAS Publications Series, 2008, v. 31, p. 81, doi. 10.1051/eas:0831016
- Article
37
- EAS Publications Series, 2008, v. 31, p. 77, doi. 10.1051/eas:0831015
- Jones, P. A.;
- Burton, M. G.;
- Cunningham, M. R.
- Article
38
- EAS Publications Series, 2008, v. 31, p. 73, doi. 10.1051/eas:0831014
- Article
39
- EAS Publications Series, 2008, v. 31, p. 65, doi. 10.1051/eas:0831013
- Kohno, K.;
- Muraoka, K.;
- Hatsukade, B.;
- Tanaka, K.;
- Iono, D.;
- Nakanishi, K.;
- Tosaki, T.;
- Sawada, T.;
- Kawabe, R.;
- Ezawa, H.;
- Yamaguchi, N.;
- Tamura, Y.;
- Wilson, G.;
- Yun, S. M.;
- Hughes, D.;
- Matsushita, S.;
- Pei-Ying, H.
- Article
40
- EAS Publications Series, 2008, v. 31, p. 57, doi. 10.1051/eas:0831012
- Article
41
- EAS Publications Series, 2008, v. 31, p. 53, doi. 10.1051/eas:0831011
- Article
42
- EAS Publications Series, 2008, v. 31, p. 47, doi. 10.1051/eas:0831010
- Article
43
- EAS Publications Series, 2008, v. 31, p. 43, doi. 10.1051/eas:0831009
- Kaufman, M. J.;
- Hollenbach, D. J.;
- Bergin, E.;
- Melnick, G. J.
- Article
44
- EAS Publications Series, 2008, v. 31, p. 35, doi. 10.1051/eas:0831008
- Pety, J.;
- Goicoechea, J. R.;
- Gerin, M.
- Article
45
- EAS Publications Series, 2008, v. 31, p. 29, doi. 10.1051/eas:0831007
- Article
46
- EAS Publications Series, 2008, v. 31, p. 23, doi. 10.1051/eas:0831006
- Article
47
- EAS Publications Series, 2008, v. 31, p. 19, doi. 10.1051/eas:0831005
- Cubick, M.;
- Röllig, M.;
- Ossenkopf, V.;
- Kramer, C.;
- Stutzki, J.
- Article
48
- EAS Publications Series, 2008, v. 31, p. 15, doi. 10.1051/eas:0831004
- Article
49
- EAS Publications Series, 2008, v. 31, p. 9, doi. 10.1051/eas:0831003
- Cunningham, M.;
- Lo, N.;
- Kramer, C.;
- Bains, I.;
- Jones, P.;
- Burton, M.;
- Muller, E.;
- Ossenkopf, V.
- Article
50
- EAS Publications Series, 2008, v. 31, p. 3, doi. 10.1051/eas:0831002
- Klessen, R. S.;
- Clark, P. C.;
- Glover, S. C. O.
- Article