Works matching IS 1616301X AND DT 2019 AND VI 29 AND IP 52
Results: 16
Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201908267
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Irradiation of Transition Metal Dichalcogenides Using a Focused Ion Beam: Controlled Single‐Atom Defect Creation.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201904668
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Quantum Materials with Atomic Precision: Artificial Atoms in Solids: Ab Initio Design, Control, and Integration of Single Photon Emitters in Artificial Quantum Materials.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201904557
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Atomic Mechanisms for the Si Atom Dynamics in Graphene: Chemical Transformations at the Edge and in the Bulk.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201904480
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Atom‐by‐Atom Fabrication of Single and Few Dopant Quantum Devices.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201903475
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- Article
Graphene Optoelectronics: Atomic‐Scale Spectroscopic Imaging of the Extreme‐UV Optical Response of B‐ and N‐Doped Graphene (Adv. Funct. Mater. 52/2019).
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201970356
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Contents: (Adv. Funct. Mater. 52/2019).
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201970355
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- Article
Masthead: (Adv. Funct. Mater. 52/2019).
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201970354
- Publication type:
- Article
1‐nm Si Patterning: Patterning Si at the 1 nm Length Scale with Aberration‐Corrected Electron‐Beam Lithography: Tuning of Plasmonic Properties by Design (Adv. Funct. Mater. 52/2019).
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201970353
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Special Issue: Materials and Devices with Probes and Beams: Down to the Atomic Level and Back Up (Adv. Funct. Mater. 52/2019).
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201970352
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Atomic‐Scale Manipulation and In Situ Characterization with Scanning Tunneling Microscopy.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201903770
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- Article
Patterning Si at the 1 nm Length Scale with Aberration‐Corrected Electron‐Beam Lithography: Tuning of Plasmonic Properties by Design.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201903429
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- Article
Atomic Insight into Thermolysis‐Driven Growth of 2D MoS<sub>2</sub>.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201902149
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Electronically Nonadiabatic Structural Transformations Promoted by Electron Beams.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201901901
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- Article
Atomic‐Scale Spectroscopic Imaging of the Extreme‐UV Optical Response of B‐ and N‐Doped Graphene.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201901819
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- Article
Electron‐Beam Manipulation of Silicon Impurities in Single‐Walled Carbon Nanotubes.
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- Advanced Functional Materials, 2019, v. 29, n. 52, p. N.PAG, doi. 10.1002/adfm.201901327
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- Article