Hardware security and test: Friends or enemies?
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- IT: Information Technology, 2014, v. 56, n. 4, p. 192, doi. 10.1515/itit-2013-1038
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- Article
Works matching IS 16112776 AND DT 2014 AND VI 56 AND IP 4
Results: 9
1
2
On achieving minimal size test sets for scan designs.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 150, doi. 10.1515/itit-2013-1039
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- Article
3
Testing for gate oxide short defects using the detectability interval paradigm.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 173, doi. 10.1515/itit-2013-1040
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- Publication type:
- Article
4
An effective fault ordering heuristic for SAT-based dynamic test compaction techniques.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 157, doi. 10.1515/itit-2013-1041
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- Publication type:
- Article
5
Behavior of stochastic circuits under severe error conditions.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 182, doi. 10.1515/itit-2013-1042
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- Publication type:
- Article
6
SAT-based ATPG beyond stuck-at fault testing.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 165, doi. 10.1515/itit-2013-1043
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- Publication type:
- Article
7
Preface.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 147, doi. 10.1515/itit-2014-1040
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- Publication type:
- Article
8
Testing integrated circuits.
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- IT: Information Technology, 2014, v. 56, n. 4, p. 148, doi. 10.1515/itit-2014-1043
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- Publication type:
- Article
9
Frontmatter.
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- IT: Information Technology, 2014, v. 56, n. 4, p. i, doi. 10.1515/itit-2014-frontmatter4
- Publication type:
- Article