Works matching IS 15519295 AND DT 2020 AND VI 28 AND IP 3

Results: 18

Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman – A New Non-Contact Failure Analysis Technique for Identification of <10 μm Organic Contamination in the Hard Drive and other Electronics Industries.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 26, doi. 10.1017/S1551929520000917

By:

Kansiz, Mustafa;
Prater, Craig;
Dillon, Eoghan;
Lo, Michael;
Anderson, Jay;
Marcott, Curtis;
Demissie, Abel;
Chen, Yanling;
Kunkel, Gary

Publication type:

Article

CrosswordPuzzle.

Published in:: Microscopy Today, 2020, v. 28, n. 3, p. 68, doi. 10.1017/S1551929520000905
Publication type:: Article

ELVIS: A Correlated Light-Field and Digital Holographic Microscope for Field and Laboratory Investigations.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 18, doi. 10.1017/S1551929520000899

By:

Kim, Taewoo;
Serabyn, Eugene;
Schadegg, Maximilian;
Liewer, Kurt;
Oborny, Nathan;
Kent Wallace, J.;
Rider, Stephanie;
Bedrossian, Manuel;
Lindensmith, Christian;
Nadeau, Jay

Publication type:

Article

Recipes for Consistent Selected Area Electron Diffraction Results: Part 2: Recording the SAED Pattern.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 54, doi. 10.1017/S1551929520000887

By:

Walck, Scott D.

Publication type:

Article

AFM-in-SEM as a Tool for Comprehensive Sample Surface Analysis.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 38, doi. 10.1017/S1551929520000875

By:

Novotna, Veronika;
Horak, Josef;
Konecny, Martin;
Hegrova, Veronika;
Novotny, Ondrej;
Novacek, Zdenek;
Neuman, Jan

Publication type:

Article

Electrical and Mechanical Characterization of Li Ion Battery Electrode using PinPoint™ SSRM.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 48, doi. 10.1017/S1551929520000863

By:

Pineda, John Paul;
Lee, Cathy;
Kim, Byong;
Lee, Keibock

Publication type:

Article

The National Cryo-EM Facility at Frederick National Laboratory: Operational Procedures, Methods, and Outputs.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 12, doi. 10.1017/S1551929520000851

By:

Baxa, Ulrich;
Edwards, Thomas J.;
Hutchison, Matt;
Wier, Adam D.;
Finney, Joseph;
Wang, Helen;
Subramaniam, Sriram

Publication type:

Article

Nestor Zaluzec: Next Question, Please.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 60, doi. 10.1017/S155192952000084X

By:

Varano, Cameron

Publication type:

Article

Imaging Many Proteins Frozen In situ.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 8, doi. 10.1017/S1551929520000838

By:

Carmichael, Stephen W.;
Salisbury, Jeffrey L.

Publication type:

Article

Highlights from Microscopy and Microanalysis.

Published in:: Microscopy Today, 2020, v. 28, n. 3, p. 66, doi. 10.1017/S1551929520000826
Publication type:: Article

NetNotes.

Published in:

Microscopy Today, 2020, v. 28, n. 3, p. 70, doi. 10.1017/S1551929520000814

By:

Price, Bob

Publication type:

Article

Calendar.

Published in:: 2020
Publication type:: Calendar

Dear Abbe.

Published in:: Microscopy Today, 2020, v. 28, n. 3, p. 81, doi. 10.1017/S1551929520000796
Publication type:: Article

COVID-19 and Safety in Microscopy and Microanalysis Laboratories.

Published in:

2020

By:

Price, Bob

Publication type:

Editorial

IndustryNews.

Published in:: 2020
Publication type:: Product Review

MT volume 28 issue 3 Cover and Back matter.

Published in:: Microscopy Today, 2020, v. 28, n. 3, p. b1, doi. 10.1017/S1551929520000759
Publication type:: Article

MT volume 28 issue 3 Cover and Front matter.

Published in:: Microscopy Today, 2020, v. 28, n. 3, p. f1, doi. 10.1017/S1551929520000747
Publication type:: Article

ProductNews.

Published in:: Microscopy Today, 2020, v. 28, n. 3, p. 64, doi. 10.1017/S1551929520000772
Publication type:: Article