Works matching IS 15519295 AND DT 2020 AND VI 28 AND IP 2

Results: 16

Pioneers in in situ Electron Microscopy: Lawrence (Larry) Allard, Oak Ridge National Laboratory.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 52, doi. 10.1017/S1551929520000267

By:

Varano, Cameron

Publication type:

Article

Technological Advances Make Low-Cost Infrared Microspectroscopy Routine.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 26, doi. 10.1017/S1551929520000012

By:

Renstrom, Bethany;
Minuskin, Kelly;
Egan, Bryce;
Sommer, André J.;
Schiering, David;
Ressler, Gregg

Publication type:

Article

Finding New Synthetic Routes to Complex Structural Materials.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 8, doi. 10.1017/S155192951900138X

By:

Carmichael, Stephen W.

Publication type:

Article

Highlights from Microscopy and Microanalysis.

Published in:: Microscopy Today, 2020, v. 28, n. 2, p. 58, doi. 10.1017/S1551929519001378
Publication type:: Article

Order! Order!

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 12, doi. 10.1017/S1551929520000279

By:

Russ, John C.

Publication type:

Article

An Interactive Online Electron Microscopy Platform Integrating Classroom Lectures and Lab Practice.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 46, doi. 10.1017/S1551929520000656

By:

Freed, Noah;
Butler, Devon;
Cairns, Allison;
Hugo, Rick;
Jiao, Jun;
Chen, Zhiqiang

Publication type:

Article

NetNotes.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 60, doi. 10.1017/S1551929519001366

By:

Price, Bob

Publication type:

Article

Calendar.

Published in:: 2020
Publication type:: Calendar

Recipes for Consistent Selected Area Electron Diffraction Results: Part 1: Microscope Setup.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 40, doi. 10.1017/S1551929520000255

By:

Walck, Scott D.

Publication type:

Article

Dear Abbe.

Published in:: Microscopy Today, 2020, v. 28, n. 2, p. 73, doi. 10.1017/S1551929519001342
Publication type:: Article

A Microscopy Society of America Balancing Act.

Published in:: 2020
Publication type:: Editorial

ProductNews.

Published in:: Microscopy Today, 2020, v. 28, n. 2, p. 56, doi. 10.1017/S1551929519001329
Publication type:: Article

IndustryNews.

Published in:: 2020
Publication type:: Product Review

MT volume 28 issue 2 Cover and Back matter.

Published in:: Microscopy Today, 2020, v. 28, n. 2, p. b1, doi. 10.1017/s1551929519001111
Publication type:: Article

Effect of the Silicon Drift Detector on EDAX Standardless Quant Methods.

Published in:

Microscopy Today, 2020, v. 28, n. 2, p. 34, doi. 10.1017/S1551929519001196

By:

Eggert, Frank

Publication type:

Article

MT volume 28 issue 2 Cover and Front matter.

Published in:: Microscopy Today, 2020, v. 28, n. 2, p. f1, doi. 10.1017/s155192951900110x
Publication type:: Article