Works matching IS 15519295 AND DT 2012 AND VI 20 AND IP 6

Results: 19

Industry News.

Published in:: Microscopy Today, 2012, v. 20, n. 6, p. 58, doi. 10.1017/S1551929512000831
Publication type:: Article

Nanoscale Automated Phase and Orientation Mapping in the TEM.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 38, doi. 10.1017/S1551929512000818

By:

Darbal, A. D.;
Gemmi, M.;
Portillo, J.;
Rauch, E.;
Nicolopoulos, S.

Publication type:

Article

This New Mineral is Out of This World!

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 8, doi. 10.1017/S1551929512000788

By:

Carmichael, Stephen W.

Publication type:

Article

MTO volume 20 issue 6 Cover and Back matter.

Published in:: Microscopy Today, 2012, v. 20, n. 6, p. b1, doi. 10.1017/S1551929512000934
Publication type:: Article

Electrochemical Strain Microscopy: Probing Electrochemical Transformations in Nanoscale Volumes.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 10, doi. 10.1017/S1551929512000764

By:

Kalinin, Sergei V.;
Kim, Yunseok;
Kumar, Amit;
Strelcov, Evgheny;
Balke, Nina;
Arruda, Thomas M.;
Jesse, Stephen;
Leonard, Donovan;
Borisevich, Albina

Publication type:

Article

Product News.

Published in:: Microscopy Today, 2012, v. 20, n. 6, p. 60, doi. 10.1017/S1551929512000843
Publication type:: Article

MTO volume 20 issue 6 Cover and Front matter.

Published in:: Microscopy Today, 2012, v. 20, n. 6, p. f1, doi. 10.1017/S1551929512000922
Publication type:: Article

Nanoscale Chemical Mapping by Local Infrared Spectroscopy (nano-FTIR).

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 28, doi. 10.1017/S1551929512000867

By:

Schiefer, Stefan;
Huth, Florian;
Hillenbrand, Rainer

Publication type:

Article

Dear Abbe.

Published in:: Microscopy Today, 2012, v. 20, n. 6, p. 73, doi. 10.1017/S1551929512000879
Publication type:: Article

Multimodal Optical Nanoprobe for Advanced In-Situ Electron Microscopy.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 32, doi. 10.1017/S1551929512000892

By:

Zhu, Y.;
Milas, M.;
Han, M.-G.;
Rameau, J.D.;
Sfeir, M.

Publication type:

Article

Contamination Cleaning of TEM/SEM Samples with the ZONE Cleaner.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 44, doi. 10.1017/S1551929512000752

By:

Soong, Charles;
Woo, Patrick;
Hoyle, David

Publication type:

Article

Index to Advertisers.

Published in:: Microscopy Today, 2012, v. 20, n. 6, p. 74, doi. 10.1017/S1551929512000910
Publication type:: Article

Equipment Funding Opportunities and Strategies for Success (Part 3).

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 54, doi. 10.1017/S1551929512000806

By:

Edelmann, Richard E.

Publication type:

Article

Microscopy Today at 20.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 7, doi. 10.1017/S155192951200082X

By:

Lyman, Charles

Publication type:

Article

Calendar - Meetings and Courses.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 70, doi. 10.1017/S1551929512000946

By:

Webster, Paul

Publication type:

Article

Atomic Force Microscopy with Raman and Tip-Enhanced Raman Spectroscopy.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 22, doi. 10.1017/S1551929512000855

By:

Kaemmer, Stefan B.;
Ruiter, Ton;
Pittenger, Bede

Publication type:

Article

NetNotes.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 62, doi. 10.1017/S1551929512000880

By:

Phillips, Thomas E.

Publication type:

Article

Applications of AFM-IR—Diverse Chemical Composition Analyses at Nanoscale Spatial Resolution.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 16, doi. 10.1017/S1551929512000776

By:

Marcott, Curtis;
Lo, Michael;
Kjoller, Kevin;
Prater, Craig;
Gerrard, David P.

Publication type:

Article

Pioneers in Optics: Antonie van Leeuwenhoek and James Clerk Maxwell.

Published in:

Microscopy Today, 2012, v. 20, n. 6, p. 50, doi. 10.1017/S155192951200079X

By:

Davidson, Michael W.

Publication type:

Article