Works matching IS 15519295 AND DT 2011 AND VI 19 AND IP 3

Results: 19

MTO volume 19 issue 3 Cover and Back matter.

Published in:: Microscopy Today, 2011, v. 19, n. 3, p. b1, doi. 10.1017/S155192951100040X
Publication type:: Article

MTO volume 19 issue 3 Cover and Front matter.

Published in:: Microscopy Today, 2011, v. 19, n. 3, p. f1, doi. 10.1017/S1551929511000393
Publication type:: Article

Index to Advertisers.

Published in:: Microscopy Today, 2011, v. 19, n. 3, p. 74, doi. 10.1017/S1551929511000381
Publication type:: Article

Augmenting Secondary Education with Advanced Microscopy.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 48, doi. 10.1017/S155192951100037X

By:

Queenan, Craig;
Calabro, Alyssa;
Becker, David

Publication type:

Article

Microscopy is Only Skin Deep.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 8, doi. 10.1017/S1551929511000368

By:

Carmichael, Stephen W.

Publication type:

Article

Product News.

Published in:: Microscopy Today, 2011, v. 19, n. 3, p. 60, doi. 10.1017/S1551929511000356
Publication type:: Article

Industry News.

Published in:: Microscopy Today, 2011, v. 19, n. 3, p. 58, doi. 10.1017/S1551929511000344
Publication type:: Article

Dear Abbe.

Published in:: Microscopy Today, 2011, v. 19, n. 3, p. 71, doi. 10.1017/S1551929511000332
Publication type:: Article

World's Largest Microscopy Exhibition.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 7, doi. 10.1017/S1551929511000320

By:

Lyman, Charles

Publication type:

Article

NetNotes.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 62, doi. 10.1017/S1551929511000319

By:

Phillips, Thomas E.

Publication type:

Article

A Design-of-Experiments Approach to Characterizing Beam-Induced Deposition in the Helium Ion Microscope.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 22, doi. 10.1017/S1551929511000307

By:

Scipioni, Larry;
Sanford, Colin;
van Veldhoven, Emile;
Maas, Diederik

Publication type:

Article

Manipulating Spectra with DTSA-II.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 34, doi. 10.1017/S1551929511000290

By:

Ritchie, Nicholas W. M.

Publication type:

Article

Calendar.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 68, doi. 10.1017/S1551929511000289

By:

Webster, Paul

Publication type:

Article

Pioneers in Optics: Joseph Jackson Lister and Maksymilian Pluta.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 54, doi. 10.1017/S1551929511000277

By:

Davidson, Michael W.

Publication type:

Article

Nanoparticles and Public Health.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 72, doi. 10.1017/S1551929511000265

By:

Cliff, Graham

Publication type:

Article

Use of the Rise Distance Method to Measure Beam Size of a FIB.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 28, doi. 10.1017/S1551929511000253

By:

Orloff, J.;
Roussel, L.

Publication type:

Article

Evaluating the Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 40, doi. 10.1017/S1551929511000241

By:

Kenik, Edward A.

Publication type:

Article

Still “Plenty of Room at the Bottom” for Aberration-Corrected TEM.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 10, doi. 10.1017/S155192951100023X

By:

Jinschek, Joerg R.;
Yucelen, Emrah;
Freitag, Bert;
Calderon, Hector A.;
Steinbach, Andy

Publication type:

Article

Low-Cost, Atmospheric-Pressure Scanning Transmission Electron Microscopy.

Published in:

Microscopy Today, 2011, v. 19, n. 3, p. 16, doi. 10.1017/S1551929511000228

By:

de Jonge, Niels;
Ring, Elisabeth A.;
Bigelow, Wilbur C.;
Veith, Gabriel M.

Publication type:

Article