Works matching IS 15519295 AND DT 2009 AND VI 17 AND IP 5

Results: 19

Challenges and Opportunities for Focused Ion Beam Processing at the Nano-Scale.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 14, doi. 10.1017/S1551929509000479

By:

Gierak, J.;
Schiedt, B.;
Lucot, D.;
Madouri, A.;
Bourhis, E.;
Patriarche, G.;
Ulysse, C.;
Lafosse, X.;
Auvray, L.;
Bruchhaus, L.;
Jede, R.

Publication type:

Article

MTO volume 17 issue 5 Cover and Front matter.

Published in:: Microscopy Today, 2009, v. 17, n. 5, p. f1, doi. 10.1017/S1551929509000467
Publication type:: Article

MTO volume 17 issue 5 Cover and Back matter.

Published in:: Microscopy Today, 2009, v. 17, n. 5, p. b1, doi. 10.1017/S1551929509000455
Publication type:: Article

Index to Advertisers.

Published in:: Microscopy Today, 2009, v. 17, n. 5, p. 74, doi. 10.1017/S1551929509000443
Publication type:: Article

Digital Image Ethics for a New Generation.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 72, doi. 10.1017/S1551929509000431

By:

Cromey, D. W.

Publication type:

Article

Dear Abbe.

Published in:: Microscopy Today, 2009, v. 17, n. 5, p. 71, doi. 10.1017/S155192950900042X
Publication type:: Article

Net Notes.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 62, doi. 10.1017/S1551929509000418

By:

Phillips, Thomas E.

Publication type:

Article

Industry News.

Published in:: Microscopy Today, 2009, v. 17, n. 5, p. 58, doi. 10.1017/S1551929509000406
Publication type:: Article

Early Use of Reflection Electron Diffraction in the TEM.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 56, doi. 10.1017/S155192950900039X

By:

Gibbon, Donald L.

Publication type:

Article

Pioneers in Optics: Pierre de Fermat and Sir George Biddell Airy.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 52, doi. 10.1017/S1551929509000388

By:

Davidson, Michael W.

Publication type:

Article

Design and Implementation of a Practical, Hands-On TEM Short Course.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 46, doi. 10.1017/S1551929509000376

By:

Nicholls, Alan;
Schumacher, Elaine

Publication type:

Article

Low-Energy Focused Ion Beam Milling Provides Reduced Damage During TEM Sample Preparation.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 40, doi. 10.1017/S1551929509000364

By:

Roussel, Laurent

Publication type:

Article

Embrittled Ancient Silver and Iron Objects and Their Conservation.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 34, doi. 10.1017/S1551929509000352

By:

Wanhill, Russell

Publication type:

Article

Benefits of Microwave-Assisted Processing Go Beyond Time Savings.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 28, doi. 10.1017/S1551929509000340

By:

Giberson, Richard T.;
Sanders, Mark A.

Publication type:

Article

New Method to Quantify Angiogenesis in vivo Using Multi-photon Imaging.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 24, doi. 10.1017/S1551929509000339

By:

Herron, B. J.;
Smith, J. S.;
Cole, R. W.

Publication type:

Article

New Ion Probe for Next Generation FIB, SIMS, and Nano-Ion Implantation.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 18, doi. 10.1017/S1551929509000315

By:

Smith, N. S.;
Tesch, P. P.;
Martin, N. P.;
Boswell, R. W.

Publication type:

Article

The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 10, doi. 10.1017/S1551929509000303

By:

Smith, David J.;
Dahmen, Uli

Publication type:

Article

Using Quantum Dots to Demonstrate Kiss-and-Run.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 6, doi. 10.1017/S1551929509000297

By:

Carmichael, Stephen W.

Publication type:

Article

MT-10 Awards.

Published in:

Microscopy Today, 2009, v. 17, n. 5, p. 5, doi. 10.1017/S1551929509000285

By:

Lyman, Charles

Publication type:

Article