Works matching IS 15519295 AND DT 2009 AND VI 17 AND IP 5
Results: 19
Challenges and Opportunities for Focused Ion Beam Processing at the Nano-Scale.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 14, doi. 10.1017/S1551929509000479
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- Publication type:
- Article
MTO volume 17 issue 5 Cover and Front matter.
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- Microscopy Today, 2009, v. 17, n. 5, p. f1, doi. 10.1017/S1551929509000467
- Publication type:
- Article
MTO volume 17 issue 5 Cover and Back matter.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. b1, doi. 10.1017/S1551929509000455
- Publication type:
- Article
Index to Advertisers.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 74, doi. 10.1017/S1551929509000443
- Publication type:
- Article
Digital Image Ethics for a New Generation.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 72, doi. 10.1017/S1551929509000431
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- Publication type:
- Article
Dear Abbe.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 71, doi. 10.1017/S155192950900042X
- Publication type:
- Article
Net Notes.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 62, doi. 10.1017/S1551929509000418
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- Article
Industry News.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 58, doi. 10.1017/S1551929509000406
- Publication type:
- Article
Early Use of Reflection Electron Diffraction in the TEM.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 56, doi. 10.1017/S155192950900039X
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- Publication type:
- Article
Pioneers in Optics: Pierre de Fermat and Sir George Biddell Airy.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 52, doi. 10.1017/S1551929509000388
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- Publication type:
- Article
Design and Implementation of a Practical, Hands-On TEM Short Course.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 46, doi. 10.1017/S1551929509000376
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- Publication type:
- Article
Low-Energy Focused Ion Beam Milling Provides Reduced Damage During TEM Sample Preparation.
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- Microscopy Today, 2009, v. 17, n. 5, p. 40, doi. 10.1017/S1551929509000364
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- Publication type:
- Article
Embrittled Ancient Silver and Iron Objects and Their Conservation.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 34, doi. 10.1017/S1551929509000352
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- Publication type:
- Article
Benefits of Microwave-Assisted Processing Go Beyond Time Savings.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 28, doi. 10.1017/S1551929509000340
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- Publication type:
- Article
New Method to Quantify Angiogenesis in vivo Using Multi-photon Imaging.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 24, doi. 10.1017/S1551929509000339
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- Publication type:
- Article
New Ion Probe for Next Generation FIB, SIMS, and Nano-Ion Implantation.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 18, doi. 10.1017/S1551929509000315
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- Publication type:
- Article
The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 10, doi. 10.1017/S1551929509000303
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- Publication type:
- Article
Using Quantum Dots to Demonstrate Kiss-and-Run.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 6, doi. 10.1017/S1551929509000297
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- Publication type:
- Article
MT-10 Awards.
- Published in:
- Microscopy Today, 2009, v. 17, n. 5, p. 5, doi. 10.1017/S1551929509000285
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- Publication type:
- Article