Works matching IS 15370755 AND DT 2023 AND VI 25 AND IP 2
1
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 46
- Article
2
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 44, doi. 10.31399/asm.edfa.2023-2.p044
- Antoniou, Nicholas;
- Foran, Brendan
- Article
9
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 39
- Article
10
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 38
- Article
11
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 36
- Article
12
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 34
- Article
13
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 33
- Article
14
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 32
- Sood, Bhanu P.;
- Rickhaus,Qnami, Peter
- Article
17
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 16, doi. 10.31399/asm.edfa.2023-2.p016
- Safont-Andreu, Anna;
- Schekotihin, Konstantin;
- Burmer, Christian;
- Hollerith, Christian;
- Xue Ming
- Article
20
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 9, doi. 10.31399/asm.edfa.2023-2.p009
- Article
21
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 4, doi. 10.31399/asm.edfa.2023-2.p004
- Douglass, David;
- Godin, Kyle
- Article
22
- Electronic Device Failure Analysis, 2023, v. 25, n. 2, p. 2
- Beaudoin, Felix;
- Parente, Renee;
- Demarest, James
- Article