Works matching IS 15370755 AND DT 2017 AND VI 19 AND IP 4
2
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 62, doi. 10.31399/asm.edfa.2017-4.p062
- Article
3
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 60
- Article
7
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 50, doi. 10.31399/asm.edfa.2017-4.p050
- Article
8
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 12, doi. 10.31399/asm.edfa.2017-4.p012
- Amster, Oskar;
- Friedman, Stuart;
- Yongliang Yang;
- Stanke, Fred
- Article
9
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 4, doi. 10.31399/asm.edfa.2017-4.p004
- Article
10
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 2
- Article
11
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 36, doi. 10.31399/asm.edfa.2017-4.p036
- Principe, E. L.;
- Asadizanjani, Navid;
- Forte, Domenic;
- Tehranipoor, Mark;
- Chivas, Robert;
- DiBattista, Michael;
- Silverman, Scott
- Article
12
- Electronic Device Failure Analysis, 2017, v. 19, n. 4, p. 22, doi. 10.31399/asm.edfa.2017-4.p022
- Susanto, Edy;
- Goh, S. H.;
- Manlangit, Edmund C.;
- Lam, Jeffrey
- Article