Works matching IS 15370755 AND DT 2016 AND VI 18 AND IP 3
7
- Electronic Device Failure Analysis, 2016, v. 18, n. 3, p. 48
- Article
13
- Electronic Device Failure Analysis, 2016, v. 18, n. 3, p. 36
- Article
15
- 2016
- Bafleur, Marise;
- Perdu, Philippe
- Proceeding
16
- Electronic Device Failure Analysis, 2016, v. 18, n. 3, p. 21
- Article
17
- Electronic Device Failure Analysis, 2016, v. 18, n. 3, p. 18, doi. 10.31399/asm.edfa.2016-3.p018
- Article
18
- Electronic Device Failure Analysis, 2016, v. 18, n. 3, p. 10, doi. 10.31399/asm.edfa.2016-3.p010
- Goh, S. H.;
- Yeoh, B. L.;
- You, G. F.;
- Chan, Y. H.;
- Zhao Lin;
- Lam, Jeffrey
- Article
19
- Electronic Device Failure Analysis, 2016, v. 18, n. 3, p. 4, doi. 10.31399/asm.edfa.2016-3.p004
- Article
20
- 2016
- Janković, Nebojša;
- Zachariasse, Frank
- Editorial