Works matching IS 1535864X AND DT 2008 AND VI 12 AND IP 2

Results: 10

45nm Transistor Reliability.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 131

By:

Hicks, Jeffrey;
Bergstrom, Daniel;
Hattendorf, Mike;
Jopling, Jason;
Maiz, Jose;
Sangwoo Pae;
Prasad, Chetan;
Wiedemer, Jami

Publication type:

Article

Flip-Chip Packaging Technology for Enabling 45nm Products.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 145

By:

Patel, Neha M.;
Wakharkar, Vijay;
Agrahram, Sairam;
Deshpande, Nitin;
Mengzhi Pang;
Tanikella, Ravindra;
Manepalli, Rahul;
Stover, Pat;
Jackson, James;
Mahajan, Ravi;
Tiwari, Prabhat

Publication type:

Article

45nm Design for Manufacturing.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 121

By:

Webb, Clair

Publication type:

Article

45nm SRAM Technology Development and Technology Lead Vehicle.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 111

By:

Bhattacharya, Uddalak;
Yih Wang;
Hamzaoglu, Fatih;
Yong-Gee Ng;
Liqiong Wei;
Zhanping Chen;
Rohlman, Joe;
Young, Ian;
Zhang, Kevin

Publication type:

Article

Managing Process Variation in Intel's 45nm CMOS Technology.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 93

By:

Kuhn, Kelin;
Kenyon, Chris;
Kornfeld, Avner;
Liu, Mark;
Maheshwari, Atul;
Wei-kai Shih;
Sivakumar, Sam;
Taylor, Greg;
VanDerVoorn, Peter;
Zawadzki, Keith

Publication type:

Article

Process and Electrical Results for the On-die Interconnect Stack for Intel's 45nm Process Generation.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 87

By:

Moon, Peter;
Chikarmane, Vinay;
Fischer, Kevin;
Grover, Rohit;
Ibrahim, Tarek A.;
Ingerly, Doug;
Lee, Kevin J.;
Litteken, Chris;
Mule, Tony;
Williams, Sarah

Publication type:

Article

45nm High-k+Metal Gate Strain-Enhanced Transistors.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 77

By:

Auth, Chris;
Buehler, Mark;
Cappellani, Annalisa;
Chi-Hing Choi;
Ding, Gary;
Weimin Han;
Joshi, Subhash;
McIntyre, Brian;
Prince, Matt;
Ranade, Pushkar;
Sandford, Justin;
Thomas, Christopher

Publication type:

Article

Technical Reviewers for Q2 2008 ITJ.

Published in:: Intel Technology Journal, 2008, v. 12, n. 2, p. 77
Publication type:: Article

Foreword.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 77

By:

Holt, Bill

Publication type:

Article

Preface.

Published in:

Intel Technology Journal, 2008, v. 12, n. 2, p. 77

By:

Lin Chao

Publication type:

Article