Works matching IS 14381656 AND DT 2014 AND VI 16 AND IP 5


Results: 22
    1
    2

    A New In Situ Microscopy Approach to Study the Degradation and Failure Mechanisms of Time-Dependent Dielectric Breakdown: Set-Up and Opportunities.

    Published in:
    Advanced Engineering Materials, 2014, v. 16, n. 5, p. 486, doi. 10.1002/adem.201400088
    By:
    • Zschech, Ehrenfried;
    • Liao, Zhongquan;
    • Gall, Martin;
    • Yeap, Kong Boon;
    • Sander, Christoph;
    • Aubel, Oliver;
    • Mühle, Uwe;
    • Gluch, Jürgen;
    • Niese, Sven;
    • Standke, Yvonne;
    • Rosenkranz, Rüdiger;
    • Löffler, Markus;
    • Vogel, Norman;
    • Beyer, Armand;
    • Engelmann, Hans‐Jürgen;
    • Guttmann, Peter;
    • Schneider, Gerd
    Publication type:
    Article
    3
    4
    5
    6
    7
    8

    Thermal Management Material: Graphite.

    Published in:
    Advanced Engineering Materials, 2014, v. 16, n. 5, p. 494, doi. 10.1002/adem.201300418
    By:
    • Inagaki, Michio;
    • Kaburagi, Yutaka;
    • Hishiyama, Yoshihiro
    Publication type:
    Article
    9
    10
    11
    12
    13
    14
    15
    16
    17
    18
    19
    20
    21
    22