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How Cutting-Edge Atomic Resolution Microscopy Can Help to Solve Some of the World's Energy Problems.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. xcvii, doi. 10.1017/S1431927614013154
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International Union of Microbeam Analysis Societies (IUMAS) 2014.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. cxxi, doi. 10.1017/S1431927614013208
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- Article
Microscopical Society of Canada / Société de Microscopie du Canada 2014.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. cxviii, doi. 10.1017/S1431927614013191
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- Article
International Metallographic Society.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. cxiii, doi. 10.1017/S143192761401318X
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- Article
MAS Awards.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. cviii, doi. 10.1017/S1431927614013178
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- Article
Microscopy Society of America.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. ci, doi. 10.1017/S1431927614013166
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- Article
Welcome to this Microscopy and Microanalysis meeting, M & M 2014 in Hartford, Connecticut!
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. xciv, doi. 10.1017/S1431927614013142
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- Article
Welcome from the Society Presidents.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. xciii, doi. 10.1017/S1431927614013130
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- Article
MAM volume 20 issue s3 Cover and Back matter.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. b1, doi. 10.1017/S1431927614012653
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- Article
MAM volume 20 issue s3 Cover and Front matter.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. f1, doi. 10.1017/S1431927614012641
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- Article
Elemental Analysis of Cells and Tissues.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2180, doi. 10.1017/S143192761401263X
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Mass Spectrometry of Surfaces Using Ion Beams: Molecular Mapping of (Bio)Polymers.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2178, doi. 10.1017/S1431927614012628
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Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2176, doi. 10.1017/S1431927614012616
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Advances in Acquisition and Analysis of Hyperspectral Images.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2166, doi. 10.1017/S1431927614012562
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Impacts of Atom Probe Tomography on the Electronic and Photonic Device Technology.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2172, doi. 10.1017/S1431927614012598
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- Article
H. G. J. Moseley; the Scientist Who Put the Z in ZAF (and kAB).
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2170, doi. 10.1017/S1431927614012586
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Teaching with the Microscopy Society of America’s Sandbox.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2156, doi. 10.1017/S1431927614012513
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Robert E Ogilvie: Inventor, MAS Founder, and Educator.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2174, doi. 10.1017/S1431927614012604
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Multi-spectral Electron Microprobe - Now and the Future.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2164, doi. 10.1017/S1431927614012550
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My Lab is on Mars: Geochemical Adventures with the Mars Curiosity Rover.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2162, doi. 10.1017/S1431927614012549
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Metallographic and Fractographic Contributions to Understanding Environmentally Assisted Cracking.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2160, doi. 10.1017/S1431927614012537
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Atomic-Resolution X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopes: Current Limits and Challenges toward Quantification.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2168, doi. 10.1017/S1431927614012574
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The Benefit and Impact of On-Line Tools for Microscopy and Microanalysis Training and Education in Core Facilities.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2158, doi. 10.1017/S1431927614012525
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Middle School Classroom Materials--Structure and Failure of Wood: A Computational and Micrographic Examination.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2154, doi. 10.1017/S1431927614012501
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Microscopy: “Swiss Army Knife” of Science.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2152, doi. 10.1017/S1431927614012495
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Measuring Protein Interactions Using Förster Resonance Energy Transfer and Fluorescence Lifetime Imaging Microscopy.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2130, doi. 10.1017/S1431927614012380
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Microscopy Society of America Certified Electron Microscopy Technician.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2148, doi. 10.1017/S1431927614012471
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Microscopy and Team-based Interdisciplinary Materials Research to Achieve 21st Century Skills.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2146, doi. 10.1017/S143192761401246X
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Technologists’ Forum Roundtable Discussion: Doing Great Science on a Tight Budget.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2132, doi. 10.1017/S1431927614012392
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A Brief Tutorial for the STEM-CELL Software.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2134, doi. 10.1017/S1431927614012409
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Microscopy Education and Outreach Through Local Societies and Introductory Courses.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2150, doi. 10.1017/S1431927614012483
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Live-cell Imaging Using Fluorescence Microscopy.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2128, doi. 10.1017/S1431927614012379
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EMCD – Magnetic Chiral Dichroism in the Electron Microscope.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2136, doi. 10.1017/S1431927614012410
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Science Museum and University Collaborations for Public Engagement - the Nanoscale Informal Science Education Network (NISE Net).
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2144, doi. 10.1017/S1431927614012458
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Practical Considerations for Single Molecule Localization Microscopy Sample Preparation.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2142, doi. 10.1017/S1431927614012446
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Getting the Most out of Direct Detection Cameras for Low-Dose Transmission Electron Microscopy.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2140, doi. 10.1017/S1431927614012434
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Template Matching, Alignment and Averaging of Sub-Tomograms in Electron Cryo-Tomography Reconstructions using Jsubtomo.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2138, doi. 10.1017/S1431927614012422
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A Picture is Worth a Thousand Words but Quantitation is Worth a Thousand Micrographs.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2126, doi. 10.1017/S1431927614012367
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Volatile p-Nitroaniline as Matrix for High Spatial Resolution Imaging of Phospholipids in Both Ion Modes by AP-MALDI-IMS.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2116, doi. 10.1017/S1431927614012318
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Elemental Quantification and Visualization of GaN Structures using APT and SIMS.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2112, doi. 10.1017/S143192761401229X
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Osseointegration of Titanium Ti-6Al-4V Alloy Implants in the Rat Femur: A Time-course SEM Study.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2110, doi. 10.1017/S1431927614012288
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Investigations on the Microstructure and Microanalysis of the Gas Shale Sample Prepared by SEM Ion Mill by Off-Centering the Ion Beams.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2108, doi. 10.1017/S1431927614012276
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Structural and Morphological Investigations of β-Cyclodextrin-Coated Silver Nanoparticles.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2114, doi. 10.1017/S1431927614012306
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After Capture: Fundamentals of Images, their Storage, Visualization, Processing and Quantification.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2124, doi. 10.1017/S1431927614012355
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Choosing a Fluorescence Microscopy Imaging Modality for Live Quantitative Experiments.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2122, doi. 10.1017/S1431927614012343
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Arrays Produced by Electron Beam Nanolithography from Fe3O4 Compressed Nanoparticles Targets.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2120, doi. 10.1017/S1431927614012331
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Nucleated growth of iron pyrite on highly oriented pyrolytic graphite (hopg) by chemical vapor deposition (CVD).
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2118, doi. 10.1017/S143192761401232X
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The Practical Aspects of ToF-SIMS Analysis in the Industrial and Contract Laboratory Setting.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2098, doi. 10.1017/S1431927614012227
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Sliding-induced Microstructure of Cold-Sprayed Copper Coating Observed by Electron Channeling Contrast Imaging.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2104, doi. 10.1017/S1431927614012252
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Applications of Low Voltage Field Emission Scanning Electron Microscopy (FE-SEM) for Characterization of Polyethersulfone/ Polyvinylpyrillidone (PES/PVP) Based Materials for Membrane Separations.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 2100, doi. 10.1017/S1431927614012239
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