Works in Microscopy & Microanalysis, 2011, Vol 17, Issue 4


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    Compositional Analysis with Atomic Column Spatial Resolution by 5th-Order Aberration-Corrected Scanning Transmission Electron Microscopy.

    Published in:
    Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 578, doi. 10.1017/S1431927611000213
    By:
    • Hernández-Maldonado, David;
    • Herrera, Miriam;
    • Alonso-González, Pablo;
    • González, Yolanda;
    • González, Luisa;
    • Gazquez, Jaume;
    • Varela, María;
    • Pennycook, Stephen J.;
    • Guerrero-Lebrero, María de la Paz;
    • Pizarro, Joaquín;
    • Galindo, Pedro L.;
    • Molina, Sergio I.
    Publication type:
    Article
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