Works matching IS 1431-9276 AND VI 16 AND IP 1 AND DT 2010


Results: 13
    1
    2
    3

    Spatial Resolution in Atom Probe Tomography.

    Published in:
    Microscopy & Microanalysis, 2010, v. 16, n. 1, p. 99, doi. 10.1017/S1431927609991267
    By:
    • Gault, Baptiste;
    • Moody, Michael P.;
    • De Geuser, Frederic;
    • La Fontaine, Alex;
    • Stephenson, Leigh T.;
    • Haley, Daniel;
    • Ringer, Simon P.
    Publication type:
    Article
    4
    5
    6
    7
    8
    9
    10
    11
    12
    13

    Characterization of SiGe Films for Use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905).

    Published in:
    Microscopy & Microanalysis, 2010, v. 16, n. 1, p. 1, doi. 10.1017/S1431927609991231
    By:
    • Marinenko, Ryna B.;
    • Turner, Shirley;
    • Simons, David S.;
    • Rabb, Savelas A.;
    • Zeisler, Rolf L.;
    • Yu, Lee L.;
    • Newbury, Dale E.;
    • Paul, Rick L.;
    • Ritchie, Nicholas W. M.;
    • Leigh, Stefan D.;
    • Winchester, Michael R.;
    • Richter, Lee J.;
    • Meier, Douglas C.;
    • Scott, Keana C. K.;
    • Klinedinst, Donna;
    • Small, John A.
    Publication type:
    Article