Works matching IS 14256908 AND DT 2000 AND VI 6 AND IP 2
1
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 295, doi. 10.1515/jaa.2000.295
- Article
2
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 283, doi. 10.1515/jaa.2000.283
- Article
3
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 259, doi. 10.1515/jaa.2000.259
- Article
4
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 251, doi. 10.1515/jaa.2000.251
- Article
5
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 227, doi. 10.1515/jaa.2000.227
- ZADRZYŃSKA, E.;
- ZAJĄCZKOWSKI, W. M.
- Article
6
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 213, doi. 10.1515/jaa.2000.213
- DEL PRETE, I.;
- DI IORIO, M.;
- HOLÁ, L.
- Article
7
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 187, doi. 10.1515/jaa.2000.187
- Article
8
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 173, doi. 10.1515/jaa.2000.173
- Article
9
- Journal of Applied Analysis, 2000, v. 6, n. 2, p. 159, doi. 10.1515/jaa.2000.159
- CIESIELSKI, K.;
- SHELAH, S.
- Article