Works matching IS 13542575 AND DT 2024 AND VI 66 AND IP 11
1
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 713
- Article
2
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 702
- Article
3
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 676, doi. 10.1784/insi.2024.66.11.676
- Sheng Bao;
- Qiang Luo;
- Yan Li;
- Jingxuan Hong
- Article
4
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 702
- Article
5
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 690, doi. 10.1784/insi.2024.66.11.690
- Qiang Ruiru;
- Zhao Xiaoqiang
- Article
6
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 682, doi. 10.1784/insi.2024.66.11.682
- Xiaohong Lu;
- Chao Jiang;
- Zhuo Sun;
- Guochuan Sui;
- Shixuan Sun
- Article
7
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 705
- Article
8
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 667, doi. 10.1784/insi.2024.66.11.667
- Hongwei Qin;
- Ruirong Dang;
- Bo Dang
- Article
9
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 661, doi. 10.1784/insi.2024.66.11.661
- Senming Zhong;
- Ping Yao;
- Xiaojun Wang;
- Bo Zeng;
- Jianbin Luo
- Article
10
- 2024
- Stephens, Ian;
- Parsons, Alan;
- Naylor, Bob
- Obituary
11
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 658
- Article
12
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 656
- Article
13
- Insight: Non-Destructive Testing & Condition Monitoring, 2024, v. 66, n. 11, p. 654
- Article