Works matching IS 10637850 AND DT 2018 AND VI 44 AND IP 5
Results: 25
Stream Processing of Multichannel EEG Data Using Parallel Computing Technology with NVIDIA CUDA Graphics Processors.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 453, doi. 10.1134/S1063785018050188
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Increase in the Surface Strength of Titanium Implanted with Argon Ions.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 450, doi. 10.1134/S1063785018050243
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Recovering the Architecture of Links in a Chain of Three Unidirectionally Coupled Systems Using the Granger-Causality Test.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 445, doi. 10.1134/S1063785018050206
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Diagnostics of the Brain Neural-Ensemble States Using MEG Records and Artificial Neural-Network Concepts.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 441, doi. 10.1134/S1063785018050176
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Elastic Scattering of Mo-Mo, Mo-S and S-S Atomic Pairs in the Relative Kinetic Energy Range of 2-200 eV.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 438, doi. 10.1134/S1063785018050231
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Low-Energy Defectless Dry Etching of the AlGaN/AlN/GaN HEMT Barrier Layer.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 435, doi. 10.1134/S1063785018050218
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Decreasing Work Function of Carbon Nanotubes Hydrogenated in Hydrogen Plasma.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 432, doi. 10.1134/S1063785018050164
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Exciting Chaotic and Quasi-Periodic Oscillations in a Multicircuit Oscillator with a Common Control Scheme.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 428, doi. 10.1134/S1063785018050267
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Local Oscillations of Silicon-Silicon Bonds in Silicon Nitride.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 424, doi. 10.1134/S1063785018050279
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Approximation of the Influence of Effective Magnetic Parameters on the Coercivity of Iron-Based Nanocrystalline Films.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 420, doi. 10.1134/S106378501805019X
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A Precise Algorithm of Memristor Switching to a State with Preset Resistance.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 416, doi. 10.1134/S106378501805022X
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Studying the Surface Conductivity of a Thallium Bilayer on Si(111) Substrate after Adsorption of Lithium and Rubidium.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 412, doi. 10.1134/S1063785018050255
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A Microwave Bandpass Filter on Dielectric Layers with Metal Grids.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 408, doi. 10.1134/S1063785018050152
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The Character of Deformations at the Interface of Elastic Media under the Slip Condition.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 404, doi. 10.1134/S1063785018050048
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A Neural-Network Method of Predicting Defect Formation on the Surface of Thin ITO Films under Mechanical Load.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 401, doi. 10.1134/S1063785018050073
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Intensification of a Laminar Flow in a Narrow Microchannel with Single-Row Inclined Oval-Trench Dimples.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 398, doi. 10.1134/S1063785018050061
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Production of Nanoscale Detonation Carbon using a Pulse Gas-Detonation Device.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 395, doi. 10.1134/S1063785018050139
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The Embedment of Conjugated MDMO−PPV Polymer in Microcavities of Porous Silicon at Excess Pressure from Solution.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 392, doi. 10.1134/S1063785018050103
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Current-Oscillation Power Growth in a Semiconductor Superlattice with Regard to Interminiband Tunneling.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 388, doi. 10.1134/S1063785018050115
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Electron Temperature Distribution Measurements in Clouds of Polystyrene Pellets Ablating in LHD Heliotron Plasma.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 384, doi. 10.1134/S1063785018050127
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Local Anodic Oxidation of Graphene Layers on SiC.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 381, doi. 10.1134/S1063785018050024
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Model of a SiGe 130-nm 10- to 30-GHz Chaotic Self-Oscillating System.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 378, doi. 10.1134/S106378501805005X
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A Method for Calculating the Spectrum of Lyapunov Exponents for Delay Systems.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 374, doi. 10.1134/S1063785018050085
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Dynamic Microwave Conductivity of Graphene-Based Shungite.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 371, doi. 10.1134/S1063785018050036
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An Experimental Study of the Effect of Nanoparticle Additives on the Rheological Properties of a Suspension.
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- Technical Physics Letters, 2018, v. 44, n. 5, p. 367, doi. 10.1134/S1063785018050097
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