Works matching IS 10637850 AND DT 2012 AND VI 38 AND IP 9
Results: 25
Measure of synchronism of multidimensional chaotic sequences based on their symbolic representation in a T-alphabet.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 804, doi. 10.1134/S106378501209009X
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Mechanism of electric frequency tuning in composite resonators based on epitaxial ferrite films.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 865, doi. 10.1134/S1063785012090258
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IR magnetotransmission and magnetoresistance of NdSrMnO manganite films on LaAlO substrate.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 835, doi. 10.1134/S1063785012090234
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Molecular-beam epitaxy of (Ga,Mn)As crystal nanowires on surface GaAs(100).
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 816, doi. 10.1134/S1063785012090040
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Seed layers on RABiTS tapes for Second-Generation HTS wires.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 849, doi. 10.1134/S1063785012090209
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Photoluminescence excitation spectroscopy technique modified for studying structures with self-assembled Ge(Si)/Si(001) nanoislands.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 828, doi. 10.1134/S1063785012090179
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Nanofluids for energetics: effect of stabilization on the critical heat flux at boiling.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 856, doi. 10.1134/S1063785012090192
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A miniature dual-band filter based on microstrip dual-mode resonators.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 839, doi. 10.1134/S1063785012090180
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Effect of conditions of pulsed electron-beam melting for Al (film)/Ti (substrate) systems on phase formation and properties of Ti-Al surface alloys.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 780, doi. 10.1134/S1063785012090118
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A study of vacuum-ultraviolet stability of silicon photodiodes.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 812, doi. 10.1134/S1063785012090143
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Low-temperature properties of porous silicon-indium nanocomposite.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 789, doi. 10.1134/S106378501209012X
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The effect of a pulsed magnetic field on the nuclear spin echo signal in ferrite.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 853, doi. 10.1134/S1063785012090246
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Time-resolved photoluminescence of LaBr:Ce scintillation crystals under ultrasoft X-ray excitation.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 784, doi. 10.1134/S1063785012090106
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Decreasing the role of transverse spatial electron transport and increasing the output power of heterostructure field-effect transistors.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 819, doi. 10.1134/S1063785012090088
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Films of nanocrystalline graphite synthesized in dc discharge plasma as a material for electrochemical capacitors.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 800, doi. 10.1134/S1063785012090131
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Tunable acoustic resonator on a periodic domain structure.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 825, doi. 10.1134/S1063785012090222
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A model to describe the humplike feature observed in the accumulation branch of capacitance-voltage characteristics of MOS capacitors with oxide-hosted silicon nanoparticles.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 845, doi. 10.1134/S106378501209026X
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Structure and abrasive wear resistance of R6M5 steel-tungsten carbide composite coatings.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 861, doi. 10.1134/S1063785012090210
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The threshold of nanopore formation in ion-implanted platinum.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 822, doi. 10.1134/S1063785012090076
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Stabilization of the NiF orthorhombic phase in epitaxial heterostructures on CaF/Si(111) substrates.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 809, doi. 10.1134/S1063785012090039
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Measuring parameters of volume nanosecond pulsed discharge in air at atmospheric pressure.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 793, doi. 10.1134/S1063785012090052
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Dependence of the piezoactivity of zinc oxide films on the conditions of synthesis in critical regimes of glow discharge.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 843, doi. 10.1134/S1063785012090167
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Calculating correlation factor for substrate and film coating profiles according to data of atomic force microscopy.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 777, doi. 10.1134/S1063785012090064
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Control of the flow over wing airfoils in transonic regimes by means of force action of surface elements on the flow.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 797, doi. 10.1134/S1063785012090027
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Electric explosion and breakdown in thin electrolyte layers.
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- Technical Physics Letters, 2012, v. 38, n. 9, p. 832, doi. 10.1134/S1063785012090271
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