Works matching IS 10637850 AND DT 2012 AND VI 38 AND IP 8
Results: 23
Spin-polarized light-emitting diodes based on heterostructures with a GaAs/InGaAs/GaAs quantum well and ferromagnetic GaMnSb injection layer.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 764, doi. 10.1134/S1063785012080184
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Controlling optical response of Opal/GeSbTe hybrid film structures.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 768, doi. 10.1134/S1063785012080251
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Mössbauer studies of structural properties and electrochemical characteristics of LiFePO.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 715, doi. 10.1134/S1063785012080081
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A microstrip diplexer based on dual-mode resonators.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 743, doi. 10.1134/S1063785012080172
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Specific features of a transition from the regular two-dimensional to three-dimensional waves on falling liquid films.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 739, doi. 10.1134/S1063785012080159
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High-power free-electron maser with frequency multiplication operating in a shortwave part of the millimeter wave range.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 759, doi. 10.1134/S1063785012080160
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Reconstruction of the coupling architecture in an ensemble of coupled time-delay systems.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 687, doi. 10.1134/S1063785012080135
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Studying the morphology of hemispherical-grain polycrystalline silicon films.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 732, doi. 10.1134/S1063785012080202
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The effect of elastic stresses on super-high-frequency magnetic impedance of amorphous magnetic microwires.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 719, doi. 10.1134/S106378501208010X
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Forming luminescent grains via decomposition of supersaturated PbS-CdS solid solution.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 750, doi. 10.1134/S1063785012080196
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Construction of kernels G of the nonlinear collision integral in the Boltzmann equation for arbitrary l.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 706, doi. 10.1134/S106378501208007X
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Thin magnetite films on an oxidized silicon surface: Raman spectroscopy study.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 772, doi. 10.1134/S106378501208024X
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The influence of natural and stimulated oxidation on luminescent properties of silicon-cellulose nanocomposites.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 723, doi. 10.1134/S1063785012080093
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- Article
The interaction of thermocapillary perturbations with 3D waves in a heated falling liquid film.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 711, doi. 10.1134/S1063785012080044
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Experimental study of heat generation at the vertex of a fatigue crack.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 736, doi. 10.1134/S1063785012080238
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Small atomic clusters on graphene: A model approach.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 699, doi. 10.1134/S1063785012080056
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Maximum magnetoelectric susceptibility in composite magnetostrictive piezotransformers controlled by a magnetic field.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 695, doi. 10.1134/S1063785012080111
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Spectra of X-ray emission from low-pressure gas discharge with runaway electrons.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 747, doi. 10.1134/S1063785012080226
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Investigation of the adsorbate effect on current of preexplosion field emission under high-voltage gas discharge.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 726, doi. 10.1134/S1063785012080020
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Comparison of the early stage of low-temperature degradation in ZrO(YO) and ZrO(MgO) ceramics.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 755, doi. 10.1134/S1063785012080214
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Pulsed X-ray luminescence of composites consisting of inorganic particles and organic phosphors.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 691, doi. 10.1134/S1063785012080123
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Mass-spectrometric online monitoring of metabolism for estimation of adequacy of anesthesia.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 729, doi. 10.1134/S1063785012080068
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On the possibility of direct determination of elastic constants of thin films in the transverse direction to the film plane.
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- Technical Physics Letters, 2012, v. 38, n. 8, p. 703, doi. 10.1134/S1063785012080032
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