Works matching IS 10637850 AND DT 2010 AND VI 36 AND IP 2
Results: 29
Convective coherent structures in a Hele-Shaw cell.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 181, doi. 10.1134/S1063785010020264
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Catalytic growth of nanostructures from carbonaceous substrates: Properties and model notions.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 170, doi. 10.1134/S1063785010020239
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Enhanced emission during submillisecond low-energy electron beam generation in a diode with grid-stabilized plasma cathode and open anode plasma boundary.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 158, doi. 10.1134/S1063785010020203
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Features of the strain hardening of nickel titanium in the region of thermoelastic martensite transformation.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 156, doi. 10.1134/S1063785010020197
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Variation in the phase composition and hardness of TiNi alloys exposed to magnetic fields.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 151, doi. 10.1134/S1063785010020173
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Mass separation of ions in a circular plasma flow.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 185, doi. 10.1134/S1063785010020276
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Tunable inversionless laser for the far-infrared and terahertz range based on nanoheterostructures with quantum wells.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 96, doi. 10.1134/S1063785010020021
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Correlations study in shock wave/turbulent boundary layer interaction.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 104, doi. 10.1134/S1063785010020045
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Contact electrization of natural diamond crystals.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 162, doi. 10.1134/S1063785010020215
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Contact atomic force microscopy of biological tissues.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 130, doi. 10.1134/S1063785010020112
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Electric field distribution at the electrode edge during surface discharge.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 126, doi. 10.1134/S1063785010020100
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Electric switching in bistable ferrite-piezoelectric microwave resonator.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 166, doi. 10.1134/S1063785010020227
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Ultrabroadband generators of noiselike high-frequency and microwave oscillations with electron feedback.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 112, doi. 10.1134/S1063785010020069
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Decrease in the incoherent near-edge X-ray scattering in narrow waveguides.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 133, doi. 10.1134/S1063785010020124
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- Article
Experimental proof of the existence of a surface electromagnetic wave.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 136, doi. 10.1134/S1063785010020136
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X-ray scattering on multilayer porous structures.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 122, doi. 10.1134/S1063785010020094
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- Article
Spectrally sensitive MOS photovaricaps based on CdZnTe and CdS crystals.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 153, doi. 10.1134/S1063785010020185
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Diagnostics of fast processes by charged particle beams at TWAC-ITEP accelerator-accumulator facility.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 177, doi. 10.1134/S1063785010020252
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Voltage-tuned relativistic backward wave oscillator.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 140, doi. 10.1134/S1063785010020148
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Spectroscopic investigations of the stability of porous silicon structure obtained by etching Si(100) in aqueous ammonium fluoride solution.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 119, doi. 10.1134/S1063785010020082
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Features of the spectra of optical emission from high-frequency discharge plasma during bismuth ferrite sputtering.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 192, doi. 10.1134/S106378501002029X
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Detecting quasi-periodic {11 n} ( n = 7–11) faces in samples with Ge/Si quantum dots by grazing X-ray reflectometry.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 108, doi. 10.1134/S1063785010020057
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LEDs (λ<sub>max</sub> = 3.6 μm) with cone-shaped light-emitting surfaces.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 144, doi. 10.1134/S106378501002015X
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Far-infrared radiation absorption cross section of clusterized water vapor.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 173, doi. 10.1134/S1063785010020240
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Controlling the wavelength of InGaAs/GaAs/InGaP lasers by ion implantation.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 189, doi. 10.1134/S1063785010020288
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Phase qubit on a superconducting single-junction interferometer.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 93, doi. 10.1134/S106378501002001X
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Growth and properties of single crystals of Si<sub>1 − x</sub>Ge<sub> x</sub> (0 < x < 0.35) solid solutions.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 115, doi. 10.1134/S1063785010020070
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Effect of Si(100)- c(4 × 12)-Al and Si(111)-(5.55 × 5.55)-Cu reconstructions on the deposition of cobalt onto silicon surface.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 100, doi. 10.1134/S1063785010020033
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Experimental study of the generalized synchronization of chaotic oscillations in the presence of noise.
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- Technical Physics Letters, 2010, v. 36, n. 2, p. 148, doi. 10.1134/S1063785010020161
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