Works matching IS 10637850 AND DT 2010 AND VI 36 AND IP 10
Results: 28
Stability of electric characteristics of Au films on Si(111)5.55 × 5.55-Cu surface exposed to oxygen.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 875, doi. 10.1134/S1063785010100019
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- Article
Estimating the effect of C and C radicals and neutral clusters on the fullerene formation.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 895, doi. 10.1134/S106378501010007X
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On the degree of blocking of the surface recombination of photogenerated carriers in semiconductors by the subsurface variband layer.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 929, doi. 10.1134/S1063785010100160
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Numerical simulation of atomic nitrogen formation in plasma of glow discharge in nitrogen-argon mixture.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 918, doi. 10.1134/S1063785010100135
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Estimating characteristics of ensemble of coupled delay-feedback systems from their experimental time series.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 902, doi. 10.1134/S1063785010100093
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- Article
Thermal stability of PMMA-fullerene C nanocomposite: A spectroscopic study.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 960, doi. 10.1134/S1063785010100251
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- Article
Free-electron maser with high-selectivity Bragg resonator using coupled propagating and trapped modes.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 952, doi. 10.1134/S1063785010100238
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Burst character of thermoelastic shape memory deformation in ferromagnetic Ni-Fe-Ga-Co alloy.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 914, doi. 10.1134/S1063785010100123
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Effect of anchoring energy on results of helix pitch determination in nematocholesteric liquid crystals.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 885, doi. 10.1134/S1063785010100044
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Temperature dependence of the dielectric parameters of thin arsenic triselenide layers with high bismuth content.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 966, doi. 10.1134/S1063785010100275
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Effect of the anisotropy of confining field on the structure of dusty plasma clusters.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 910, doi. 10.1134/S1063785010100111
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Increasing the operating frequency in high-power distributed microgate bipolar switches.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 945, doi. 10.1134/S1063785010100214
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- Article
Effect of heat treatment on the structure of titanium dioxide films.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 942, doi. 10.1134/S1063785010100202
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- Article
Ultrafast turn-off of high currents by field-controlled integrated thyristor.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 926, doi. 10.1134/S1063785010100159
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Pulsed operation of low-power plasma thruster.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 889, doi. 10.1134/S1063785010100056
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- Article
Low-intensity electroluminescence in polymer-based ionic conductors.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 964, doi. 10.1134/S1063785010100263
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Liquid-liquid phase transition in aqueous solutions of n-hydrocarbons and amphiphiles.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 892, doi. 10.1134/S1063785010100068
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Self-induced separation of laminar boundary layer and viscid-inviscid interaction over porous surface.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 906, doi. 10.1134/S106378501010010X
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Magnetic field intensity in near field zone of loop antenna for RFID systems.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 882, doi. 10.1134/S1063785010100032
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- Article
Functionalization of the surface of multiwalled carbon nanotubes.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 878, doi. 10.1134/S1063785010100020
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New approach to metrology in nanotechnology.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 938, doi. 10.1134/S1063785010100196
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Field evaporation ion sources based on alloys and compounds.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 949, doi. 10.1134/S1063785010100226
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Anisotropic properties of materials synthesized in porous matrices.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 957, doi. 10.1134/S106378501010024X
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Reducing the error of residual wedge angle measurement on plates by shear interferometry.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 969, doi. 10.1134/S1063785010100287
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Tunable generator of broadband chaotic microwave oscillations on turbulent electron beams.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 899, doi. 10.1134/S1063785010100081
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- Article
Nonlinear response and two stable electroconducting states in transparent plasticized PVC films.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 923, doi. 10.1134/S1063785010100147
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Vacuum field-emission triode based on electron multiplier concentrator.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 935, doi. 10.1134/S1063785010100184
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Rapid analysis of monolithic substances by atomic emission spectroscopy.
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- Technical Physics Letters, 2010, v. 36, n. 10, p. 933, doi. 10.1134/S1063785010100172
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