Works matching IS 10637850 AND DT 2006 AND VI 32 AND IP 9
Results: 24
Effect of substrate material on the structure of carbon films obtained by plasmachemical deposition.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 735, doi. 10.1134/S106378500609001X
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Quasi-viscous fracture of brittle media with stochastic pore distribution.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 738, doi. 10.1134/S1063785006090021
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Magnetooptical study of the near-surface micromagnetic structure and local magnetic properties of NiFe/Cu nanocomposite microwires.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 741, doi. 10.1134/S1063785006090033
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Initial stages of subnanosecond electric pulse breakdown in high-pressure gas discharge gaps.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 745, doi. 10.1134/S1063785006090045
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Transport properties of thermally oxidized porous silicon.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 750, doi. 10.1134/S1063785006090057
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Determining nanometer vibration amplitudes using two spectral components of a semiconductor laser autodyne signal.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 754, doi. 10.1134/S1063785006090069
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Carbon supported polyaniline as anode catalyst: Pathway to platinum-free fuel cells.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 758, doi. 10.1134/S1063785006090070
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Degradation processes induced by nonstationary electric signals in metallization systems on silicon.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 762, doi. 10.1134/S1063785006090082
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Stationary heat transfer in a multiprobe cryosurgery system.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 765, doi. 10.1134/S1063785006090094
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Evaluating the order and reconstructing the model equations of a time-delay system.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 768, doi. 10.1134/S1063785006090100
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Effect of one-sided periodic pulsed energy supply on aerodynamic characteristics of wing profiles.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 772, doi. 10.1134/S1063785006090112
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Giant nonreciprocal effect under conditions of mutual influence of ferromagnetic and chiral resonances.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 775, doi. 10.1134/S1063785006090124
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Garnet ferrite films with two thermostable frequencies of ferromagnetic resonance.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 779, doi. 10.1134/S1063785006090136
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Optical properties of SnO<sub>2− x </sub> nanolayers.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 782, doi. 10.1134/S1063785006090148
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Effect of a strong electric field on the high-frequency properties of a helical quantum wire.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 785, doi. 10.1134/S106378500609015X
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Autoparametric oscillatory system with chaotic dynamics.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 788, doi. 10.1134/S1063785006090161
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Mössbauer study of the nature of differences in the uniaxial magnetic anisotropy of FeAlN and FeTaN films.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 791, doi. 10.1134/S1063785006090173
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Influence of the free surface and the plastically deformed zone size on the screening of the disclination elastic field.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 795, doi. 10.1134/S1063785006090185
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Internal friction and brittle-ductile transition in structural materials.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 799, doi. 10.1134/S1063785006090197
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Forming n-p junctions based on p-CdHgTe with low charge carrier density.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 802, doi. 10.1134/S1063785006090203
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Generalized K entropy and Gibbs entropy of a system of point vortices.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 806, doi. 10.1134/S1063785006090215
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Theory of X-ray diffraction on a lateral crystal with elastically bent lattice planes.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 809, doi. 10.1134/S1063785006090227
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Interval estimators of coupling between switched systems.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 813, doi. 10.1134/S1063785006090239
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Self-assembling of zinc and tellurium impurities in zinc-blende MgS.
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- Technical Physics Letters, 2006, v. 32, n. 9, p. 818, doi. 10.1134/S1063785006090240
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