Works matching IS 10637850 AND DT 2004 AND VI 30 AND IP 6
Results: 29
Photoemission from Gallium Nitride.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 451, doi. 10.1134/1.1773331
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Cathode-Initiated Breakdown in Vacuum.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 445, doi. 10.1134/1.1773329
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The Effect of Spatiotemporal Fluctuations on the Pulse Propagation.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 448, doi. 10.1134/1.1773330
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Concentration Inhomogeneities and Phase Diagrams of Eutectic Systems.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 452, doi. 10.1134/1.1773332
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Effective HF(DF) Lasers Pumped by Nonchain Chemical Reaction Initiated by Self-Sustained Discharge.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 454, doi. 10.1134/1.1773333
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Depinning at the Initial Stage of the Resistive Transition in Superconductors with a Fractal Cluster Structure.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 457, doi. 10.1134/1.1773334
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Experimental Study of the Concentration Dependence of Resistivity in Disordered Macrosystems of the Insulator–Semiconductor Type.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 461, doi. 10.1134/1.1773335
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Transformation of the Surface Structure of Bending-Strained Muscovite Crystals.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 463, doi. 10.1134/1.1773336
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Lateral Emitter as a Base Element of Integrated Emission Electronics.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 466, doi. 10.1134/1.1773337
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Jointing Fragments of a Speckle Diffuser.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 469, doi. 10.1134/1.1773338
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The Long-Range Action of Light on the Microhardness of Metals in Stratified Heterogeneous Systems.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 471, doi. 10.1134/1.1773339
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Intermittency of Space Charge Waves.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 474, doi. 10.1134/1.1773340
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EPR Spectra and Relaxation Times of Natural π-Conjugated Polymers Doped with Iodine.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 477, doi. 10.1134/1.1773341
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The Effect of Hydrogen on the Electric Conductivity of Tin Oxide Doped with Yttrium.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 480, doi. 10.1134/1.1773342
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Acoustic Channels and Lenses in a Medium with Inhomogeneous Velocity Field.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 483, doi. 10.1134/1.1773343
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Copper-Containing Nanocomposites: Synthesis and Phase Composition.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 485, doi. 10.1134/1.1773344
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Experimental Study of the Concentration Dependence of the Real Part of Permittivity in a Paraffin–Graphite Disordered Macrosystem.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 487, doi. 10.1134/1.1773345
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Solution of the Inverse Problem of X-ray Diffraction on Periodic InGaN/GaN/Al<sub>2</sub>O<sub>3</sub> Nanostructures.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 489, doi. 10.1134/1.1773346
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Electrical Properties of Metal–Dysprosium Oxide–Gadolinium Oxide–Silicon Structures.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 494, doi. 10.1134/1.1773347
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Molecular-Dynamics Study of Dynamic Vortex Defects as the Mechanism of Relaxation in Loaded Solids.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 497, doi. 10.1134/1.1773348
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Measurement of High-Power Microwave Pulses by Resistive Hot-Electron Sensors.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 500, doi. 10.1134/1.1773349
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The Parameters of Phase Separation in NT-50 Alloy Calculated from the Internal Friction Kinetics.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 503, doi. 10.1134/1.1773350
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Accelerating Diffraction Structure of the π Type.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 507, doi. 10.1134/1.1773351
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Field Evaporation of Tungsten in the Presence of Adsorbed Water.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 509, doi. 10.1134/1.1773352
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Silicon Passivated by Two-Layer Insulating Films of Ytterbium Oxide and Dysprosium Oxide.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 512, doi. 10.1134/1.1773353
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Measuring the Polarization Characteristics of Birefringent Optical Fibers Using an Interference Technique.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 515, doi. 10.1134/1.1773354
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The Effect of Optical Radiation on the Semiconductor Conductivity in a Thin-Film Ferroelectric–Semiconductor Structure.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 518, doi. 10.1134/1.1773355
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Frequency-Selective Josephson Detector: Power Dynamic Range at Subterahertz Frequencies.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 522, doi. 10.1134/1.1773356
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Conditions Preventing Thermal Breakdown in Semiconductor Devices.
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- Technical Physics Letters, 2004, v. 30, n. 6, p. 525, doi. 10.1134/1.1773357
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