Works matching IS 10637850 AND DT 2004 AND VI 30 AND IP 4
Results: 28
Peculiarities of the Oxidation of Porous Silicon during Aqueous After-Etching.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 259, doi. 10.1134/1.1748593
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Effective Fiber-Optic Polarization Modulator.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 262, doi. 10.1134/1.1748594
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The Antimicrobial Action of High-Power Electric Discharge in Water. Part 2. Experimental Results.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 281, doi. 10.1134/1.1748600
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The Effect of Hydrogen on the Shear Modulus of Quasibinary Alloys of the TiNi–TiCu System.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 270, doi. 10.1134/1.1748596
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The Effect of Exposure to Arsenic Flow on the Optical Properties of Quantum Dot Arrays in the InAs/GaAs(100) System.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 272, doi. 10.1134/1.1748597
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A Particle Energy Analyzer of the Cylindrical Mirror Type.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 275, doi. 10.1134/1.1748598
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Multifractal Properties of Grain Structures in Sodium Niobate Based Binary Ceramics with Nonisostructural Components.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 278, doi. 10.1134/1.1748599
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The Townsend Coefficient and Electron Runaway Characteristics in Nitrogen.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 265, doi. 10.1134/1.1748595
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Spin Polarized Electron Spectroscopy of Thin Vanadium Films on a (110)FeNi<sub>3</sub> Surface.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 284, doi. 10.1134/1.1748601
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Photoelectron Emission Caused by Surface Plasmons in Silver Nanoparticles.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 304, doi. 10.1134/1.1748607
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Duration of the Process of Complete Synchronization of Two Coupled Identical Chaotic Systems.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 291, doi. 10.1134/1.1748603
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Velocities of Nanometer-Scale Displacements Determined Using the Autodyne Signal Spectrum of a Quantum-Confined Semiconductor Structure Laser.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 295, doi. 10.1134/1.1748604
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Local Enhanced Evaporation of Carbon Pellets in a Wendelstein 7-AS Stellarator.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 298, doi. 10.1134/1.1748605
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Electron Transport in Xenon–Hydrogen Gas Mixtures.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 301, doi. 10.1134/1.1748606
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Statistical Modeling of the Ion–Plasma Sputter Deposition of Thin YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7 – x</sub> High-Temperature Superconductor Films.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 287, doi. 10.1134/1.1748602
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On the Possibility of Using Indium Nitride in Thermophotovoltaic Converters.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 307, doi. 10.1134/1.1748608
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The Laws of Plane Defect Wave Propagation across the Interface between Two Viscoplastic Media.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 309, doi. 10.1134/1.1748609
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Laser Doppler Chromatic Imaging of Rotating Structures.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 313, doi. 10.1134/1.1748610
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One-Dimensional Fractal Walk at a Finite Free Motion Velocity.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 316, doi. 10.1134/1.1748611
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Analytical Solution of the Takagi Equations for X-ray Backscattering from a Cylindrically Bent Crystal.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 319, doi. 10.1134/1.1748612
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Surface States at the Nanoparticle–Polymer Matrix Interface.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 322, doi. 10.1134/1.1748613
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Luminescence Quenching in Erbium-Doped Phosphate Glass Films Irradiated with Hydrogen Ions.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 325, doi. 10.1134/1.1748614
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Fast Neutron Bombardment Induced Semiconductor–Metal Electron Transition in Lead Selenide.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 328, doi. 10.1134/1.1748615
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A Planar Prism for Detection and Selective Excitation of Modes in a Multimode Channel Waveguide.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 332, doi. 10.1134/1.1748616
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The Effect of Applied Voltage on the Formation of a Subnanosecond Electron Beam in a Gas-Filled Diode.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 335, doi. 10.1134/1.1748617
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Dispersion of the Plastic Strain Localization Waves.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 338, doi. 10.1134/1.1748618
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Maxwell–Wagner Relaxation in Magnetoelectric Composites.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 341, doi. 10.1134/1.1748619
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The Formation and Characterization of Freon 22 Cluster Beams.
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- Technical Physics Letters, 2004, v. 30, n. 4, p. 345, doi. 10.1134/1.1748620
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