Works matching IS 10637850 AND DT 2002 AND VI 28 AND IP 12
Results: 31
A Laser Operating on the Interband Transitions in Quantum Wells with Coherent Electron Transport.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 971, doi. 10.1134/1.1535505
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The Effect of Microtopography and Deposition Regime on the Field Emission Properties of Graphitelike Carbon Films.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 975, doi. 10.1134/1.1535506
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Electroluminescence of Si–SiO[sub 2]–Si[sub 3]N[sub 4] Structures.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 978, doi. 10.1134/1.1535507
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Tunneling Spectroscopy of Palladium–Barium Emitters.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 981, doi. 10.1134/1.1535508
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The Energy Position of Electrically Active Centers in the Oxide Layer of SIMOX Structures.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 983, doi. 10.1134/1.1535509
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Quasi-Stationary Distribution of Relativistic Particles in a Bent Crystal.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 986, doi. 10.1134/1.1535510
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The Dynamics of Annealing of Ion-Amorphized Silicon by Nanosecond Pulses of Excimer Laser UV Radiation.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 988, doi. 10.1134/1.1535511
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- Article
Temperature-Induced Variation of the Emission Band Intensities of an SrAl[sub 12]O[sub 19]:Pr Phosphor.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 991, doi. 10.1134/1.1535512
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High-Temperature Annealing of Bulk GaN Layers.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 994, doi. 10.1134/1.1535513
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On the Heat Exchange between a Probing Nanoparticle and a Surface through Near-Field Modes of a Fluctuational Electromagnetic Field.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 997, doi. 10.1134/1.1535514
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Two-Wavelength Emission from a GaInPAsSb/InAs Structure with a Broken-Gap Isotype Heterojunction and a p–n Junction in the Substrate.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1001, doi. 10.1134/1.1535484
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Temperature Dependence of the Elastic and Inelastic Moduli of YBa[sub 2]Cu[sub 3]O[sub 7 – δ] Ceramics.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1004, doi. 10.1134/1.1535485
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Effect of the Ellipticity of a Dielectric Resonator on the Induced Whispering Gallery Modes.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1007, doi. 10.1134/1.1535486
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Investigation of the p[sup –]-3C-SiC/n[sup +]-6H-SiC Heterostructures with Modulated Doping.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1011, doi. 10.1134/1.1535487
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Wavelet Analysis of Fluctuations of Laser Radiation Scattered from Interphase Boundaries in Porous Media.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1015, doi. 10.1134/1.1535488
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Elastic Stress Relaxation in Buffer Layers Based on Porous Strained InGaAs/GaAs Superlattices.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1018, doi. 10.1134/1.1535489
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The Effect of a Constant Electric Field on the Structural Parameters of Ferroelectric PbSc[sub 0.5]Nb[sub 0.5]O[sub 3] Crystals.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1021, doi. 10.1134/1.1535490
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A Model of Liquid Flow in a Channel with Elastic Walls.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1024, doi. 10.1134/1.1535491
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Negative Differential Resistance in a Reverse-Biased Diode with Inhomogeneous Base.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1027, doi. 10.1134/1.1535492
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Effect of the Oxide Thickness on the Operation Speed of a Field-Effect Transistor in Terms of the Carrier Tunneling Rate.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1030, doi. 10.1134/1.1535493
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The Effect of a Linear Mode Coupling Dispersion on the Wave Packet Dynamics in an Optical Waveguide with Kerr Nonlinearity.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1033, doi. 10.1134/1.1535494
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Townsend Discharge Instability on the Right-Hand Branch of the Paschen Curve.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1036, doi. 10.1134/1.1535495
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Restoration of the Parameters of an Adsorption Layer on the Surface of a Channel Optical Waveguide.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1040, doi. 10.1134/1.1535496
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Pulsed Cathodoluminescence of Heavy Metal Azides.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1043, doi. 10.1134/1.1535497
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Thermal Stability of the Films of Polystyrene Chemically Bound to Fullerene C[sub 60]: Effect of Film Thickness in the Submicron Range.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1046, doi. 10.1134/1.1535498
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Determination of the Parameters of Phosphor Activators in Thin-Film Electroluminescent Capacitor Structures.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1049, doi. 10.1134/1.1535499
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On the Mass Separation of Quasineutral Beams.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1052, doi. 10.1134/1.1535500
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Effect of Fractal-Matrix Resonators on the Properties of Thin Copper Films.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1054, doi. 10.1134/1.1535501
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Forming Through Channels in Silicon Substrates.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1058, doi. 10.1134/1.1535502
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Instability of an Equilibrium Circular Configuration of Helical Vortices.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1060, doi. 10.1134/1.1535503
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Electric Field Potential Distribution in a Periodic Sequence of Charged Planes in a Plasma.
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- Technical Physics Letters, 2002, v. 28, n. 12, p. 1065, doi. 10.1134/1.1535504
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