Works matching IS 10637850 AND DT 2001 AND VI 27 AND IP 2
Results: 28
The Localized Gas Discharge Etching of Materials.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 108, doi. 10.1134/1.1352762
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Dispersive Resonators with Volume Holographic Gratings.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 102, doi. 10.1134/1.1352760
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Nonlinear Response of the IVCT Band in the Absorption Spectra of Molybdenum Blue and Berlin Blue.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 104, doi. 10.1134/1.1352761
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Single-Crystal Iron Garnet Films with Increased Thermal Stability of Magnetization and Ferromagnetic Resonance Field.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 110, doi. 10.1134/1.1352763
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Foam Stabilization by Surfactants: A Fractal-Percolation Fracture Model.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 127, doi. 10.1134/1.1352769
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Subnanometer Resolution in Depth Profiling Using Glancing Auger Electrons.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 114, doi. 10.1134/1.1352765
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The Spherical Stratification of Discharge in High-Molecular-Mass Gases.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 118, doi. 10.1134/1.1352766
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A Strong Electromagnetic Field Generated by a Dipole.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 121, doi. 10.1134/1.1352767
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Interferometric Study of an Elongated Element Model with Axisymmetric Streamlining for Two Mach Numbers (M = 3 and 4).
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 124, doi. 10.1134/1.1352768
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Measuring the Parameters of Photorefractive Crystals by an Electrooptical Compensation Method.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 112, doi. 10.1134/1.1352764
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Electric Field Affects the Charge State in Ion-Implanted Si–SiO[sub 2] Structures.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 129, doi. 10.1134/1.1352770
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Thermostimulated Exoelectron Emission during the Structural Transition in Ca[sub 10](PO[sub 4])[sub 6](OH)[sub 2].
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 132, doi. 10.1134/1.1352771
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The Effect of Adsorption Complexes on the Electron Spectrum and Luminescence of Porous Silicon.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 134, doi. 10.1134/1.1352772
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Instantaneous Emission Brightness Kinetics of Zinc Sulfide Based Electroluminescent Thin-Film Emitters.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 138, doi. 10.1134/1.1352773
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The Velocity and Attenuation of Outgoing Surface Acoustic Waves Measured Using an Ultrasonic Microscope with Two Focusing Transducers.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 141, doi. 10.1134/1.1352774
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Beam–Plasma Discharge Dynamics in an Adiabatic Magnetic Trap.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 144, doi. 10.1134/1.1352775
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Effect of the Spin Wave Decay in the Pinning Layer on the Spin Wave Resonance Band Intensity.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 147, doi. 10.1134/1.1352776
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Relativistic Gigawatt BWT Microwave Pulse Duration Increased upon Treating the Slow-Wave Structure Surface with a Low-Energy High-Current Electron Beam.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 150, doi. 10.1134/1.1352777
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Multiparticle Tunneling during Field Electron Emission from Bi[sub 2]CaSr[sub 2]Cu[sub 2]O[sub 8].
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 153, doi. 10.1134/1.1352778
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The Field-Induced Ion Evaporation Effect in the Bipartition of Charged Droplets.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 155
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A Change in the Microwave Radiation Reflection upon a Dielectric–Metal Transition in Vanadium Dioxide.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 157, doi. 10.1134/1.1352780
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A New Integral Equation for Calculating Thin Electric Vibrators.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 160, doi. 10.1134/1.1352781
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A Decrease in the Noise Stokes Field Modulation during the Induced Mandel’shtam–Brillouin Scattering in a Single-Mode Optical Fiber with High Rayleigh Scattering Losses.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 164, doi. 10.1134/1.1352782
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Manganese Depth–Concentration Profiles in Ion-Implanted Silicon Studied by Rutherford Backscattering.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 168
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Electron Structure of Thin Fullerene Films Deposited by Various Methods.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 87, doi. 10.1134/1.1352756
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On the Adiabatic Theorem in Quantum Mechanics.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 93, doi. 10.1134/1.1352758
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“Color” Dynamics Based on a Conservative System.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 97, doi. 10.1134/1.1352759
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The Formation of Volume Elements for Microelectromechanical Systems in Polyimide by Method of Reactive Ion Beam Etching.
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- Technical Physics Letters, 2001, v. 27, n. 2, p. 90, doi. 10.1134/1.1352757
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