Works matching IS 10637850 AND DT 2000 AND VI 26 AND IP 11
Results: 28
Longitudinal Multidomain Structures Formed in an Optically Bistable System under the Action of a Collimated Annular Beam.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1000, doi. 10.1134/1.1329696
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Antireflecting Surface Coatings with Continuously Varying Complex Refractive Index.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1003, doi. 10.1134/1.1329697
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Controlled Oscillations in an Autostochastic System.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1007, doi. 10.1134/1.1329698
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A New Approach to the Development of Multifrequency Lasers.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1010, doi. 10.1134/1.1329699
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Translational Nonequilibrium of the Shock Wave Front in an Argon–Helium Gas Mixture.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1013, doi. 10.1134/1.1329700
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Asymmetry in the Nonlinear Resonance Interaction of the Capillary Oscillation Modes of a Charged Droplet.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1016, doi. 10.1134/1.1329701
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Optical Low-Frequency Absorption of Small Metal Particles.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1020, doi. 10.1134/1.1329702
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Instability Development during Motion of a Metal–Insulator Phase Boundary.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 1023, doi. 10.1134/1.1329703
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The Drift Resonance and Isolation of Charged Particles in a Toroidal Magnetic Trap Modeled Using the Newton–Lorentz Equation and a Set of the Drift Equations of Motion.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 935, doi. 10.1134/1.1329676
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- Article
Electric Charge Affects the Formation of a Wavy Microrelief on the Surface of a Viscoelastic Medium.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 940, doi. 10.1134/1.1329677
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Photoluminescence of Porous Silicon Layers Formed in Ion-Implanted Silicon Wafers.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 944, doi. 10.1134/1.1329678
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The Barkhausen Effect in a Hydrogen-Saturated Fe–B–Si–Ni Amorphous Alloy.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 947, doi. 10.1134/1.1329679
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Ferromagnetic Resonance Affected by a Superconductor.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 949, doi. 10.1134/1.1329680
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- Article
Polymer Films Studied by Scanning Tunneling Microscopy.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 952, doi. 10.1134/1.1329681
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- Article
A Special Feature in the Magnetic Moment Orientation of Highly Magnetic Phase Particles in Magnetically Hard Fe–Co–Ni–Al Alloys.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 955, doi. 10.1134/1.1329682
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- Article
The Dislocation Anharmonicity in Silicon.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 974, doi. 10.1134/1.1329688
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Preparation and Investigation of the Structure and Properties of Al[sub 2]O[sub 3] Plasma-Detonation Coatings.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 960, doi. 10.1134/1.1329684
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Dielectric Spectra of Sodium Niobate-Based Binary Systems.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 980, doi. 10.1134/1.1329690
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- Article
Cantilever Tip–Surface Contact as a Catastrophe Machine.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 967, doi. 10.1134/1.1329686
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Rapid Monitoring of the Charging Properties of Ion-Doped MOS Structures.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 971, doi. 10.1134/1.1329687
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- Article
Phase Diffraction Gratings Formed Based on the Phenomenon of Single Crystal Twinning.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 958, doi. 10.1134/1.1329683
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- Article
Electrostatic Mechanism of a Wavy Microrelief Formation on a Semiconductor Surface Sputtered by an Ion Beam.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 977
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Energy Production in Ambipolar Reactors with D–T, D–[sup 3]He, and D–D Fuel Cycles.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 964, doi. 10.1134/1.1329685
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Probability Symmetry Broken upon Rapid Period-Doubling Bifurcation.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 982, doi. 10.1134/1.1329691
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Influence of the Surface on the Impurity Solubility in Small-Size Crystals.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 986, doi. 10.1134/1.1329692
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The Effect of Condensation on the Parameters of Pulsed Supersonic Streams.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 989, doi. 10.1134/1.1329693
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Multichannel Signal Detection in a Multimode Optical-Fiber Interferometer: Reducing the Effect of Spurious Signals.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 991, doi. 10.1134/1.1329694
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Electric Current and Heat Induced Acoustic Emission in Cadmium Sulfide.
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- Technical Physics Letters, 2000, v. 26, n. 11, p. 996, doi. 10.1134/1.1329695
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