Works matching IS 10637850 AND DT 2000 AND VI 26 AND IP 10
Results: 28
Low-Frequency Dielectric Relaxation in 5TsB Liquid Crystals Controlled by the Ion Adsorption–Desorption Processes.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 849, doi. 10.1134/1.1321216
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A New Method of Layer Deposition.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 851
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A Self-Excited Hydromagnetic Dynamo Effect Can Take Place in Astrobleme Impact Melts.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 854
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Bipartition of a Strongly-Charged Droplet during Nonlinear Oscillations.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 857, doi. 10.1134/1.1321219
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Resonance in the Efficiency of the Conduction-State Formation in Ion-Bombarded Crystalline Quartz.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 861, doi. 10.1134/1.1321220
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The Effect of Fullerenes on the Dynamic Characteristics of Liquid Crystal Systems.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 864, doi. 10.1134/1.1321221
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Modeling of the Internal Circulation Constraint Formation in the FT-2 Tokamak.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 867, doi. 10.1134/1.1321222
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A Diagram of the Stable Secular Motion of Ions Trapped in an RF Quadrupole Field in the Presence of Additional Harmonic Quadrupole Excitation.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 870, doi. 10.1134/1.1321223
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A Change in the Characteristics of Fluctuations of the Boundary Plasma Parameters in the FT-2 Tokamak upon Transition to the Improved Plasma Conf inement Regime.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 873, doi. 10.1134/1.1321224
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Special Features of the Effect of Oversized Impurities on the Cascade Development in α-Iron Alloys Containing Special Carbides.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 876, doi. 10.1134/1.1321225
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Propagation of Ultrashort RF Pulses in a Polluted Atmosphere.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 879, doi. 10.1134/1.1321226
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On the Measurement of Spatially-Resolved Energy Characteristics of a High-Power Laser Radiation.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 882
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Laser Plasma Accelerated by an Optical Discharge Moving in Air at a Hypersonic Velocity.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 885, doi. 10.1134/1.1321228
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“Oscillating” Riemann Invariants of the Hyperbolic Systems of Partial Differential Equations.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 889, doi. 10.1134/1.1321229
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Cathode Layer Characteristics of a Low-Pressure Glow Discharge in Argon and Nitrogen.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 891, doi. 10.1134/1.1321230
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Effect of the Titanium Oxide Stoichiometry on the Efficiency of CO Oxidation on the Au/TiO[sub x] System Surface.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 894, doi. 10.1134/1.1321231
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Nonlinear Thermomagnetic Waves of Finite Amplitude in Superconductors.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 897, doi. 10.1134/1.1321232
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Self-Organization of a Critical State and 1/ f Fluctuations Caused by the Interaction of Phase Transitions in a Distributed System.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 900, doi. 10.1134/1.1321233
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The Low-Temperature Electric Conductivity of YBaCuO and LaSrMnO Dielectric Films Obtained by a Pulsed Laser Sputter Deposition Technique.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 903, doi. 10.1134/1.1321234
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Magnetostatic Surface Waves on a Moving Domain Boundary in a Garnet Ferrite Crystal.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 907, doi. 10.1134/1.1321235
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Laser-induced Thermal Breakdown of a Semiconductor in the Presence of Mutually Correlated Noises.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 929, doi. 10.1134/1.1321242
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The Josephson Effect in Metal–PDMS–Metal Structures.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 910, doi. 10.1134/1.1321236
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Current Transfer Processes in Thin Lutecium and Terbium Oxide Films on Silicon.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 916, doi. 10.1134/1.1321238
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Argon–Oxygen Ion-Plasma Treatment Modifies the Surface Composition and Photoluminescence Spectrum of Porous Silicon.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 919, doi. 10.1134/1.1321239
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Dispersion Characteristics of Magnetostatic Waves Propagating at a Ferrite/Perovskite Interface.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 923, doi. 10.1134/1.1321240
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A Comparative Study of the Atomic Hydrogen Penetration into Thin Vanadium Films and Silicon Oxide–Gallium Arsenide Structures.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 926, doi. 10.1134/1.1321241
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The Properties of InGaAsP/InP Heterolasers with Step-Divergent Waveguides.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 913, doi. 10.1134/1.1321237
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Coherent Oscillations Excited in Opposite Electron and Ion Beams of a Diaphragmed Discharge between Hollow Electrodes.
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- Technical Physics Letters, 2000, v. 26, n. 10, p. 932, doi. 10.1134/1.1321243
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