Works matching IS 10637850 AND DT 1999 AND VI 25 AND IP 12
Results: 32
n(p)-InP–n-In[sub 2]O[sub 3]–P[sub 2]O[sub 5]–Pd diode structures as potential sensors for near-infrared radiation, moisture, and hydrogen.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 1001, doi. 10.1134/1.1262708
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Angular dependence of the signal in nonlinear polarization spectroscopy under conditions of noncollinear excitation by partially polarized radiation.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 1004, doi. 10.1134/1.1262709
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Observation of anomalous transmission of x-rays in tungsten single crystals.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 933, doi. 10.1134/1.1262687
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Optical method of determining the components of the relative displacement vector.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 1008, doi. 10.1134/1.1262710
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Possibility of demonstrating a self-sustained fusion reaction in an ambipolar trap.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 938, doi. 10.1134/1.1262689
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Generation of subnanosecond superradiance pulses in the short-wavelength part of the millimeter range.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 927, doi. 10.1134/1.1262711
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Characteristic features of the amplification of short electromagnetic pulses during propagation along steady-state electron beams.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 930, doi. 10.1134/1.1262686
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Analysis of the fundamental absorption edge in amorphous hydrogenated carbon films.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 1006, doi. 10.1134/1.1262714
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Characteristics of cleavage fracture during interaction of nonlinear waves with the free surface of a copper single crystal.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 936, doi. 10.1134/1.1262688
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Erratum: Separation of germanium and silicon oxides by plasma-chemical deposition of germanosilicate glass in a moving plasma column [Tech. Phys. Lett. 25, 530–532 (1999)].
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 1011, doi. 10.1134/1.1262717
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Measurement of linear velocity using a resonant ring interferometer with a low-coherence light source.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 940, doi. 10.1134/1.1262712
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Field evaporation of lanthanum hexaboride and estimate of the stability of forming clusters.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 944, doi. 10.1134/1.1262715
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Surface waves at a moving plasma layer.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 947, doi. 10.1134/1.1262690
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Exact solution of the problem of an equilibrium configuration of a two-dimensional charged liquid-metal droplet.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 950, doi. 10.1134/1.1262691
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Trajectories of return surface magnetostatic waves in a ferrite–dielectric–metal structure magnetized by a nonuniform “ridge” field.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 953, doi. 10.1134/1.1262692
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Investigation of the propagation of microwave beams in an inhomogeneous plasma in a magnetic field.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 956, doi. 10.1134/1.1262693
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Deep diffusion doping of macroporous silicon.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 958, doi. 10.1134/1.1262694
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Evolution of the morphological structure of a two-dimensional cluster obtained with a linear microparticle trajectory in the diffusion-limited aggregation regime.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 962, doi. 10.1134/1.1262716
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Hyperfine structure of magnetic-resonance electrical conductivity of doped polydiacetylene.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 965, doi. 10.1134/1.1262695
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Diffusion of solvent across the surface of a resist film during centrifuging.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 967, doi. 10.1134/1.1262696
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Mechanisms for thermal stability of the electrophysical properties of overcompensated n-Si〈B,S〉.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 969, doi. 10.1134/1.1262697
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Probing of a random phase object by a focused spatially modulated laser beam. Integral scanning method.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 971, doi. 10.1134/1.1262713
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Integrated-optics semiconductor detector using a prism coupling device.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 974, doi. 10.1134/1.1262698
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Beam model of waveguide regimes in a multilayer graded-index waveguide.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 977, doi. 10.1134/1.1262699
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Influence of acoustic treatment on the photoconductivity of zinc selenide crystals.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 980, doi. 10.1134/1.1262700
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Hysteresis and metastability of the transition from evaporative to droplet flow of a liquid through a capillary.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 983, doi. 10.1134/1.1262701
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Growth of perfect-crystal Si–Si[sub 1-x]Ge[sub x]–(Ge[sub 2])[sub 1-x](InP)[sub x] structures from the liquid phase.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 986, doi. 10.1134/1.1262702
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Inversion of acoustic emission asymmetry accompanying martensitic transformations in titanium nickelide alloys.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 988, doi. 10.1134/1.1262703
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Influence of nitrogen on the tendency to packing defect formation and the temperature dependence of the thermoelectromotive force in Fe–Cr alloys.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 992, doi. 10.1134/1.1262704
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Influence of defect diffusion on the radiation resistance of the heterogeneous photoconductor CdS–PbS.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 994, doi. 10.1134/1.1262705
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Superhardness of cast iron induced by copper under laser treatment.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 997, doi. 10.1134/1.1262706
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Scanning tunneling spectroscopy of amorphous carbon: tunneling model.
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- Technical Physics Letters, 1999, v. 25, n. 12, p. 999, doi. 10.1134/1.1262707
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