Found: 34
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Study of the formation of contact between rough surfaces based on the particle method.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 178, doi. 10.1134/1.1262043
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- Article
Cross linking and thermal destruction processes in thin films formed from dilute solutions of a copolymer of trifluorochloroethylene and vinylidene fluoride.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 169, doi. 10.1134/1.1262039
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Laser autodyne interferometry of the dynamic parameters of biological specimens.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 183, doi. 10.1134/1.1262045
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Kinetics of adsorption and recombination of hydrogen atoms at a solid surface.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 176, doi. 10.1134/1.1262042
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Distortion of the spatial distribution of a laser beam reflected by a VO[sub 2] mirror.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 174, doi. 10.1134/1.1262041
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Analysis of metallofullerenes using a mass reflectron.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 167, doi. 10.1134/1.1262038
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Equilibrium states of an ion-beam plasma with magnetized electrons at low pressures.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 180, doi. 10.1134/1.1262044
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Bistability and response to hydrogen adsorption in nanostructured films based on mixed tin and titanium oxides.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 171, doi. 10.1134/1.1262040
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Determination of the uniformity of the carrier lifetime in a material from the profile of the amplitude spectrum of an ion detector.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 186, doi. 10.1134/1.1262046
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- Article
Influence of feedback on the complex dynamics of an electron beam with a virtual cathode in a virtode.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 189, doi. 10.1134/1.1262047
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- Article
Stable current oscillations accompanying magnetron sputtering of oxide targets.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 192, doi. 10.1134/1.1262048
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Condition for a time-constant current in a high-current planar diode.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 194, doi. 10.1134/1.1262049
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One-dimensional diffuser for a three-dimensional imaging system.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 197, doi. 10.1134/1.1262050
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Identification of self-organizing structures by the numerical simulation of laminar three-dimensional flow around a crater on a plane by a flow of viscous incompressible fluid.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 209, doi. 10.1134/1.1262056
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Allowance for the contribution of self-adsorption in estimates of the interphase energy in a solid-metal–own-melt system.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 201, doi. 10.1134/1.1262052
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Infrared spectroscopy of a silicon surface bombarded by nitrogen ions.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 214, doi. 10.1134/1.1262058
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Excitation of the 6[sup 3]P[sub 1] atomic level of mercury by pumping a mixture of mercury vapor and argon with a pulse-periodic nanosecond discharge.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 205, doi. 10.1134/1.1262054
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Direct bonding of silicon wafers with a diffusion layer.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 207, doi. 10.1134/1.1262055
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Instability of plane Couette flow of two-phase liquids.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 199, doi. 10.1134/1.1262051
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Investigation of the laws governing the propagation of pyrolysis and combustion waves along a laser beam in propane.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 212, doi. 10.1134/1.1262057
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- Article
Calculating the electromagnetic wave generated by the interaction between an ultrashort laser pulse and matter.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 203, doi. 10.1134/1.1262053
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Energy barriers and trapping centers in silicon metal-insulator-semiconductor structures with samarium and ytterbium oxide insulators.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 217, doi. 10.1134/1.1262059
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Characteristics of the excitation of ultrasonic waves by thin wafers of manganese zinc ferrite single crystals.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 220, doi. 10.1134/1.1262060
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Polarization properties of a four-layer dielectric waveguide.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 222, doi. 10.1134/1.1262061
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Investigation of nanocrystals in thin layers of paraffin lubricant on the surface of metals by infrared spectroscopy.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 224
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Influence of short-term annealing on the conductivity of porous silicon and the transition resistivity of an aluminum-porous silicon contact.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 226, doi. 10.1134/1.1262063
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Local polarization reversal of LiNbO[sub 3] by scanning the surface perpendicular to the axis of spontaneous polarization with a needle-shaped electrode.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 229, doi. 10.1134/1.1262064
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Properties of GaInAsSb solid solutions obtained from antimony fluxes by liquid-phase epitaxy in the spinodal decay region.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 231
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Long-wavelength uncooled sources of λ=5–6 μm radiation using graded-index InAsSb(P) layers grown by liquid-phase epitaxy.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 243, doi. 10.1134/1.1262071
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Deformation defects in polyethylene. Angular dilatons.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 235, doi. 10.1134/1.1262067
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Influence of an auxiliary planar short-circuited p-n junction positioned near a main junction.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 237, doi. 10.1134/1.1262068
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Influence of pumping uniformity on current tuning of the emission wavelength of InAsSb/InAsSbP diode lasers.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 239, doi. 10.1134/1.1262069
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Preparation of thin films of new ZnGa[sub 2]S[sub 4] wide-gap semiconductors.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 242, doi. 10.1134/1.1262070
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Low-pressure inductive rf discharge in a rare gas-halogen mixture for economical mercury-free luminescence light sources.
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- Technical Physics Letters, 1998, v. 24, n. 3, p. 233, doi. 10.1134/1.1262066
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