Works matching IS 10637842 AND DT 2020 AND VI 65 AND IP 11

Results: 27

Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1873, doi. 10.1134/S1063784220110262

By:

Toropov, M. N.;
Akhsakhalyan, A. A.;
Zorina, M. V.;
Salashchenko, N. N.;
Chkhalo, N. I.;
Tokunov, Yu. M.

Publication type:

Article

Contact Stiffness Measurements with an Atomic Force Microscope.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1866, doi. 10.1134/S1063784220110031

By:

Ankudinov, A. V.;
Khalisov, M. M.

Publication type:

Article

Microwave Volt–Impedance Spectroscopy of Semiconductors.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1859, doi. 10.1134/S1063784220110237

By:

Reznik, A. N.;
Vostokov, N. V.;
Vdovicheva, N. K.;
Shashkin, V. I.

Publication type:

Article

An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1853, doi. 10.1134/S106378422011016X

By:

Khalisov, M. M.;
Penniyaynen, V. A.;
Podzorova, S. A.;
Timoshchuk, K. I.;
Ankudinov, A. V.;
Krylov, B. V.

Publication type:

Article

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1846, doi. 10.1134/S1063784220110067

By:

Evsikov, I. D.;
Mit'ko, S. V.;
Glagolev, P. Yu.;
Djuzhev, N. A.;
Demin, G. D.

Publication type:

Article

Ion-Beam Methods for High-Precision Processing of Optical Surfaces.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1837, doi. 10.1134/S1063784220110274

By:

Zabrodin, I. G.;
Zorina, M. V.;
Kas'kov, I. A.;
Malyshev, I. V.;
Mikhailenko, M. S.;
Pestov, A. E.;
Salashchenko, N. N.;
Chernyshev, A. K.;
Chkhalo, N. I.

Publication type:

Article

The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1832, doi. 10.1134/S1063784220110158

By:

Gusev, N. S.;
Sapozhnikov, M. V.;
Udalov, O. G.;
Pashen'kin, I. Yu.;
Yunin, P. A.

Publication type:

Article

Material Surface Treatment for Design of Composite Optical Elements.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1828, doi. 10.1134/S1063784220110286

By:

Zorina, M. V.;
Kuznetsov, I. I.;
Mikhaylenko, M. S.;
Palashov, O. V.;
Pestov, A. E.;
Chkhalo, N. I.

Publication type:

Article

Deep X-Ray Reflectometry of Supermultiperiod A3B5 Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1822, doi. 10.1134/S1063784220110134

By:

Goray, L. I.;
Pirogov, E. V.;
Sobolev, M. S.;
Polyakov, N. K.;
Dashkov, A. S.;
Svechnikov, M. V.;
Bouravleuv, A. D.

Publication type:

Article

A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1814, doi. 10.1134/S1063784220110195

By:

Mitrofanov, A. V.;
Popov, A. V.;
Prokopovich, D. V.

Publication type:

Article

Multilayer Cr/Sc Mirrors with Improved Reflection for the "Water Transparency Window" Range.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1809, doi. 10.1134/S1063784220110225

By:

Polkovnikov, V. N.;
Garakhin, S. A.;
Kvashennikov, D. S.;
Malyshev, I. V.;
Salashchenko, N. N.;
Svechnikov, M. V.;
Smertin, R. M.;
Chkhalo, N. I.

Publication type:

Article

The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1800, doi. 10.1134/S1063784220110250

By:

Smertin, R. M.;
Polkovnikov, V. N.;
Salashchenko, N. N.;
Chkhalo, N. I.;
Yunin, P. A.;
Trigub, A. L.

Publication type:

Article

Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1792, doi. 10.1134/S1063784220110109

By:

Garakhin, S. A.;
Barysheva, M. M.;
Vishnyakov, E. A.;
Zuev, S. Yu.;
Kirichenko, A. S.;
Kuzin, S. V.;
Polkovnikov, V. N.;
Salashchenko, N. N.;
Svechnikov, M. V.;
Chkhalo, N. I.

Publication type:

Article

The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1786, doi. 10.1134/S1063784220110201

By:

Pleshkov, R. S.;
Zuev, S. Yu.;
Polkovnikov, V. N.;
Salashchenko, N. N.;
Svechnikov, M. V.;
Chkhalo, N. I.;
Jonnard, P.

Publication type:

Article

Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1780, doi. 10.1134/S1063784220110110

By:

Garakhin, S. A.;
Zorina, M. V.;
Zuev, S. Yu.;
Mikhailenko, M. S.;
Pestov, A. E.;
Pleshkov, R. S.;
Polkovnikov, V. N.;
Salashchenko, N. N.;
Chkhalo, N. I.

Publication type:

Article

The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1777, doi. 10.1134/S1063784220110146

By:

Gurovich, B. A.;
Prikhod'ko, K. E.;
Goncharov, B. V.;
Dement'eva, M. M.;
Kutuzov, L. V.;
Komarov, D. A.;
Domantovskii, A. G.;
Stolyarov, V. L.;
Ol'shanskii, E. D.

Publication type:

Article

Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1771, doi. 10.1134/S1063784220110213

By:

Pligovka, A.;
Yunin, P.;
Hoha, A.;
Korolyov, S.;
Gorokh, G.;
Skorokhodov, E.

Publication type:

Article

Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1767, doi. 10.1134/S106378422011002X

By:

Abrosimova, N. D.;
Drozdov, M. N.;
Obolensky, S. V.

Publication type:

Article

Using Atomic Force Microscopy in the Study of Superprotonic Crystals.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1760, doi. 10.1134/S1063784220110092

By:

Gainutdinov, R. V.;
Tolstikhina, A. L.;
Selezneva, E. V.;
Makarova, I. P.

Publication type:

Article

Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1755, doi. 10.1134/S1063784220110055

By:

Djuzhev, N. A.;
Gusev, E. E.;
Dedkova, A. A.;
Tovarnov, D. A.;
Makhiboroda, M. A.

Publication type:

Article

Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1748, doi. 10.1134/S1063784220110080

By:

Fomin, L. A.;
Malikov, I. V.;
Berezin, V. A.;
Chernykh, A. V.;
Loginov, A. B.;
Loginov, B. A.

Publication type:

Article

An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO2(Y) Films.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1744, doi. 10.1134/S1063784220110079

By:

Filatov, D. O.;
Antonov, D. A.;
Antonov, I. N.;
Ryabova, M. A.;
Gorshkov, O. N.

Publication type:

Article

Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1740, doi. 10.1134/S1063784220110183

By:

Mironov, V. L.;
Skorokhodov, E. V.;
Tatarskiy, D. A.;
Pashen'kin, I. Yu.

Publication type:

Article

Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1736, doi. 10.1134/S1063784220110171

By:

Kuzin, S. V.;
Reva, A. A.;
Bogachev, S. A.;
Erkhova, N. F.;
Salashchenko, N. N.;
Chkhalo, N. I.;
Polkovnikov, V. N.

Publication type:

Article

Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1726, doi. 10.1134/S1063784220110043

By:

Barysheva, M. M.;
Zuev, S. Yu.;
Lopatin, A. Ya.;
Luchin, V. I.;
Pestov, A. E.;
Salashchenko, N. N.;
Tsybin, N. N.;
Chkhalo, N. I.

Publication type:

Article

Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1717, doi. 10.1134/S1063784220110249

By:

Semenov, M. B.;
Krevchik, V. D.;
Filatov, D. O.;
Shorokhov, A. V.;
Shkurinov, A. P.;
Krevchik, P. V.;
Wang, Y. H.;
Li, T. R.;
Malik, A. K.;
Antonov, D. A.;
Semenov, I. M.

Publication type:

Article

Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography.

Published in:

Technical Physics, 2020, v. 65, n. 11, p. 1709, doi. 10.1134/S1063784220110122

By:

Glagolev, P. Yu.;
Demin, G. D.;
Oreshkin, G. I.;
Chkhalo, N. I.;
Djuzhev, N. A.

Publication type:

Article

Works matching IS 10637842 AND DT 2020 AND VI 65 AND IP 11

Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method.

Contact Stiffness Measurements with an Atomic Force Microscope.

Microwave Volt–Impedance Spectroscopy of Semiconductors.

An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy.

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy.

Ion-Beam Methods for High-Precision Processing of Optical Surfaces.

The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy.

Material Surface Treatment for Design of Composite Optical Elements.

Deep X-Ray Reflectometry of Supermultiperiod A<sub>3</sub>B<sub>5</sub> Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.

A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range.

Multilayer Cr/Sc Mirrors with Improved Reflection for the "Water Transparency Window" Range.

The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems.

Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility.

The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range.

Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam.

The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors.

Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems.

Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures.

Using Atomic Force Microscopy in the Study of Superprotonic Crystals.

Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph.

Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire.

An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO<sub>2</sub>(Y) Films.

Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations.

Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy.

Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation.

Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles.

Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography.