Works matching IS 10637842 AND DT 2020 AND VI 65 AND IP 11

Results: 27

Ion-Beam Methods for High-Precision Processing of Optical Surfaces.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1837, doi. 10.1134/S1063784220110274
By:
- Zabrodin, I. G.;
- Zorina, M. V.;
- Kas'kov, I. A.;
- Malyshev, I. V.;
- Mikhailenko, M. S.;
- Pestov, A. E.;
- Salashchenko, N. N.;
- Chernyshev, A. K.;
- Chkhalo, N. I.
Publication type:
Article
The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1832, doi. 10.1134/S1063784220110158
By:
- Gusev, N. S.;
- Sapozhnikov, M. V.;
- Udalov, O. G.;
- Pashen'kin, I. Yu.;
- Yunin, P. A.
Publication type:
Article
Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1792, doi. 10.1134/S1063784220110109
By:
- Garakhin, S. A.;
- Barysheva, M. M.;
- Vishnyakov, E. A.;
- Zuev, S. Yu.;
- Kirichenko, A. S.;
- Kuzin, S. V.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Svechnikov, M. V.;
- Chkhalo, N. I.
Publication type:
Article
The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1786, doi. 10.1134/S1063784220110201
By:
- Pleshkov, R. S.;
- Zuev, S. Yu.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Svechnikov, M. V.;
- Chkhalo, N. I.;
- Jonnard, P.
Publication type:
Article
Deep X-Ray Reflectometry of Supermultiperiod A3B5 Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1822, doi. 10.1134/S1063784220110134
By:
- Goray, L. I.;
- Pirogov, E. V.;
- Sobolev, M. S.;
- Polyakov, N. K.;
- Dashkov, A. S.;
- Svechnikov, M. V.;
- Bouravleuv, A. D.
Publication type:
Article
Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1873, doi. 10.1134/S1063784220110262
By:
- Toropov, M. N.;
- Akhsakhalyan, A. A.;
- Zorina, M. V.;
- Salashchenko, N. N.;
- Chkhalo, N. I.;
- Tokunov, Yu. M.
Publication type:
Article
Contact Stiffness Measurements with an Atomic Force Microscope.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1866, doi. 10.1134/S1063784220110031
By:
- Ankudinov, A. V.;
- Khalisov, M. M.
Publication type:
Article
Microwave Volt–Impedance Spectroscopy of Semiconductors.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1859, doi. 10.1134/S1063784220110237
By:
- Reznik, A. N.;
- Vostokov, N. V.;
- Vdovicheva, N. K.;
- Shashkin, V. I.
Publication type:
Article
An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1853, doi. 10.1134/S106378422011016X
By:
- Khalisov, M. M.;
- Penniyaynen, V. A.;
- Podzorova, S. A.;
- Timoshchuk, K. I.;
- Ankudinov, A. V.;
- Krylov, B. V.
Publication type:
Article
Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1846, doi. 10.1134/S1063784220110067
By:
- Evsikov, I. D.;
- Mit'ko, S. V.;
- Glagolev, P. Yu.;
- Djuzhev, N. A.;
- Demin, G. D.
Publication type:
Article
Multilayer Cr/Sc Mirrors with Improved Reflection for the "Water Transparency Window" Range.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1809, doi. 10.1134/S1063784220110225
By:
- Polkovnikov, V. N.;
- Garakhin, S. A.;
- Kvashennikov, D. S.;
- Malyshev, I. V.;
- Salashchenko, N. N.;
- Svechnikov, M. V.;
- Smertin, R. M.;
- Chkhalo, N. I.
Publication type:
Article
The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1800, doi. 10.1134/S1063784220110250
By:
- Smertin, R. M.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Chkhalo, N. I.;
- Yunin, P. A.;
- Trigub, A. L.
Publication type:
Article
Material Surface Treatment for Design of Composite Optical Elements.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1828, doi. 10.1134/S1063784220110286
By:
- Zorina, M. V.;
- Kuznetsov, I. I.;
- Mikhaylenko, M. S.;
- Palashov, O. V.;
- Pestov, A. E.;
- Chkhalo, N. I.
Publication type:
Article
A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1814, doi. 10.1134/S1063784220110195
By:
- Mitrofanov, A. V.;
- Popov, A. V.;
- Prokopovich, D. V.
Publication type:
Article
Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1780, doi. 10.1134/S1063784220110110
By:
- Garakhin, S. A.;
- Zorina, M. V.;
- Zuev, S. Yu.;
- Mikhailenko, M. S.;
- Pestov, A. E.;
- Pleshkov, R. S.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Chkhalo, N. I.
Publication type:
Article
The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1777, doi. 10.1134/S1063784220110146
By:
- Gurovich, B. A.;
- Prikhod'ko, K. E.;
- Goncharov, B. V.;
- Dement'eva, M. M.;
- Kutuzov, L. V.;
- Komarov, D. A.;
- Domantovskii, A. G.;
- Stolyarov, V. L.;
- Ol'shanskii, E. D.
Publication type:
Article
Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1771, doi. 10.1134/S1063784220110213
By:
- Pligovka, A.;
- Yunin, P.;
- Hoha, A.;
- Korolyov, S.;
- Gorokh, G.;
- Skorokhodov, E.
Publication type:
Article
Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1767, doi. 10.1134/S106378422011002X
By:
- Abrosimova, N. D.;
- Drozdov, M. N.;
- Obolensky, S. V.
Publication type:
Article
Using Atomic Force Microscopy in the Study of Superprotonic Crystals.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1760, doi. 10.1134/S1063784220110092
By:
- Gainutdinov, R. V.;
- Tolstikhina, A. L.;
- Selezneva, E. V.;
- Makarova, I. P.
Publication type:
Article
Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1755, doi. 10.1134/S1063784220110055
By:
- Djuzhev, N. A.;
- Gusev, E. E.;
- Dedkova, A. A.;
- Tovarnov, D. A.;
- Makhiboroda, M. A.
Publication type:
Article
Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1748, doi. 10.1134/S1063784220110080
By:
- Fomin, L. A.;
- Malikov, I. V.;
- Berezin, V. A.;
- Chernykh, A. V.;
- Loginov, A. B.;
- Loginov, B. A.
Publication type:
Article
An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO2(Y) Films.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1744, doi. 10.1134/S1063784220110079
By:
- Filatov, D. O.;
- Antonov, D. A.;
- Antonov, I. N.;
- Ryabova, M. A.;
- Gorshkov, O. N.
Publication type:
Article
Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1740, doi. 10.1134/S1063784220110183
By:
- Mironov, V. L.;
- Skorokhodov, E. V.;
- Tatarskiy, D. A.;
- Pashen'kin, I. Yu.
Publication type:
Article
Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1736, doi. 10.1134/S1063784220110171
By:
- Kuzin, S. V.;
- Reva, A. A.;
- Bogachev, S. A.;
- Erkhova, N. F.;
- Salashchenko, N. N.;
- Chkhalo, N. I.;
- Polkovnikov, V. N.
Publication type:
Article
Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1726, doi. 10.1134/S1063784220110043
By:
- Barysheva, M. M.;
- Zuev, S. Yu.;
- Lopatin, A. Ya.;
- Luchin, V. I.;
- Pestov, A. E.;
- Salashchenko, N. N.;
- Tsybin, N. N.;
- Chkhalo, N. I.
Publication type:
Article
Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1717, doi. 10.1134/S1063784220110249
By:
- Semenov, M. B.;
- Krevchik, V. D.;
- Filatov, D. O.;
- Shorokhov, A. V.;
- Shkurinov, A. P.;
- Krevchik, P. V.;
- Wang, Y. H.;
- Li, T. R.;
- Malik, A. K.;
- Antonov, D. A.;
- Semenov, I. M.
Publication type:
Article
Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1709, doi. 10.1134/S1063784220110122
By:
- Glagolev, P. Yu.;
- Demin, G. D.;
- Oreshkin, G. I.;
- Chkhalo, N. I.;
- Djuzhev, N. A.
Publication type:
Article

Works matching IS 10637842 AND DT 2020 AND VI 65 AND IP 11

Ion-Beam Methods for High-Precision Processing of Optical Surfaces.

The Magnetoelectric Effect in Ferroelectric/Ferromagnetic Film Hybrid Systems with Easy-Plane and Easy-Axis Anisotropy.

Broadband Mirrors for Spectroheliographs at the KORTES Sun Study Facility.

The Smoothing Effect of Si Layers in Multilayer Be/Al Mirrors for the 17- to 31-nm Range.

Deep X-Ray Reflectometry of Supermultiperiod A<sub>3</sub>B<sub>5</sub> Structures with Quantum Wells Grown by Molecular-Beam Epitaxy.

Obtaining of Smooth High-Precision Surfaces by the Mechanical Lapping Method.

Contact Stiffness Measurements with an Atomic Force Microscope.

Microwave Volt–Impedance Spectroscopy of Semiconductors.

An Investigation of the Effect of Colchicine on Living Fibroblasts by Atomic Force and Confocal Microscopy.

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy.

Multilayer Cr/Sc Mirrors with Improved Reflection for the "Water Transparency Window" Range.

The Microstructure of Transition Boundaries in Multilayer Mo/Be Systems.

Material Surface Treatment for Design of Composite Optical Elements.

A Track Membrane as a Phase Test Object for the X-Ray Spectrum Range.

Modification and Polishing of the Holographic Diffraction Grating Grooves by a Neutralized Ar Ion Beam.

The Influence of Integrated Resistors Formed under Ion Irradiation on the Superconducting Transitions of Niobium Nitride Nanoconductors.

Morphology and Structure of Defected Niobium Oxide Nonuniform Arrays Formed by Anodizing Bilayer Al/Nb Systems.

Secondary-Ion Mass Spectroscopy for Analysis of the Implanted Hydrogen Profile in Silicon and Impurity Composition of Silicon-on-Insulator Structures.

Using Atomic Force Microscopy in the Study of Superprotonic Crystals.

Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph.

Probe Microscopy and Electron-Transport Properties of Thin Mo Epitaxial Films on Sapphire.

An Atomic Force Microscopic Study of Resistive Switching Resonance Activation in ZrO<sub>2</sub>(Y) Films.

Magnetic Resonance Force Spectroscopy of Magnetic Vortex Oscillations.

Application of Novel Multilayer Normal-Incidence Mirrors for EUV Solar Spectroscopy.

Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation.

Features of Two-Dimensional Bifurcations during Dissipative Electron Tunneling in Arrays of Au Nanoparticles.

Optimization of an Anode Membrane with a Transmission-Type Target in a System of Soft X-Ray Sources for X-Ray Nanolithography.