Works matching IS 10637842 AND DT 2015 AND VI 60 AND IP 6
Results: 27
Fractal analysis of the 3D microstructure of porous materials.
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- Technical Physics, 2015, v. 60, n. 6, p. 805, doi. 10.1134/S1063784215060109
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Simulation of the nanofluid viscosity coefficient by the molecular dynamics method.
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- Technical Physics, 2015, v. 60, n. 6, p. 798, doi. 10.1134/S1063784215060237
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Asymptotic form of the matrix elements of the direct collision integral in the Boltzmann equation.
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- Technical Physics, 2015, v. 60, n. 6, p. 811, doi. 10.1134/S1063784215060274
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Internal impedance of twisted steel-aluminum wires at an industrial frequency.
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- Technical Physics, 2015, v. 60, n. 6, p. 815, doi. 10.1134/S1063784215060171
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Determination of the melt level from a real weight signal during computer-assisted crystal growth by the Stepanov (EFG) technique and the use of crucible motion as a control action.
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- Technical Physics, 2015, v. 60, n. 6, p. 820, doi. 10.1134/S1063784215060225
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Spin exchange upon collision of two cesium atoms in the ground state.
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- Technical Physics, 2015, v. 60, n. 6, p. 826, doi. 10.1134/S1063784215060079
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Fragment appearance energies in dissociative ionization of a sulfur hexafluoride molecule by electron impact.
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- Technical Physics, 2015, v. 60, n. 6, p. 830, doi. 10.1134/S1063784215060067
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Nonlinear corrections to the frequencies of surface and subsurface waves in a laminated heterogeneous liquid.
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- Technical Physics, 2015, v. 60, n. 6, p. 839, doi. 10.1134/S1063784215060250
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Kinetics of structuring of submonolayer carbon coatings on silicon (100) crystals during microwave vacuum-plasma deposition.
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- Technical Physics, 2015, v. 60, n. 6, p. 848, doi. 10.1134/S1063784215060286
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Relation between mechanical dynamic processes and the accompanying electric fields.
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- Technical Physics, 2015, v. 60, n. 6, p. 855, doi. 10.1134/S1063784215060043
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Dielectric properties of the lithium-titanium ferrite ceramics in a wide frequency range.
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- Technical Physics, 2015, v. 60, n. 6, p. 860, doi. 10.1134/S1063784215060262
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Dynamic strength of reaction-sintered boron carbide ceramic.
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- Technical Physics, 2015, v. 60, n. 6, p. 863, doi. 10.1134/S1063784215060249
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Diffracted transient radiation of a relativistic electron in a bilayer target.
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- Technical Physics, 2015, v. 60, n. 6, p. 789, doi. 10.1134/S1063784215060055
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Determination of the real crystal radius from a weight signal during growth by the Stepanov (EFG) technique.
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- Technical Physics, 2015, v. 60, n. 6, p. 873, doi. 10.1134/S1063784215060213
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AFM and XPA data on structural features and properties of films and powders based on naphthalocyanines.
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- Technical Physics, 2015, v. 60, n. 6, p. 877, doi. 10.1134/S1063784215060195
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Melting of a thin aluminum film on a dielectric substrate under a high-power ion beam.
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- Technical Physics, 2015, v. 60, n. 6, p. 885, doi. 10.1134/S1063784215060134
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Measuring complex for studying cascade solar photovoltaic cells and concentrator modules on their basis.
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- Technical Physics, 2015, v. 60, n. 6, p. 891, doi. 10.1134/S1063784215060158
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High-voltage sharp-recovery 4H:SiC drift diodes: Theoretical estimation of limiting parameters.
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- Technical Physics, 2015, v. 60, n. 6, p. 897, doi. 10.1134/S1063784215060092
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Specific imaging of caustics upon refraction of structured laser radiation in stratified media.
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- Technical Physics, 2015, v. 60, n. 6, p. 911, doi. 10.1134/S1063784215060201
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Spectrograph of charged particles consisting of a discrete plane electrode with different potential distributions and a grounded box-shaped electrode.
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- Technical Physics, 2015, v. 60, n. 6, p. 941, doi. 10.1134/S1063784215060080
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Strength of optical silica fibers measured in liquid nitrogen.
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- Technical Physics, 2015, v. 60, n. 6, p. 869, doi. 10.1134/S1063784215060031
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3D fractalization over natural colloidal microinclusions.
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- Technical Physics, 2015, v. 60, n. 6, p. 903, doi. 10.1134/S1063784215060146
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On the low-energy high-current electron beam profile controlled using ferromagnetic insertions.
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- Technical Physics, 2015, v. 60, n. 6, p. 917, doi. 10.1134/S1063784215060110
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Atomic-molecular model of boundary friction in microtribocontacts between the surfaces of semiconducting and dielectric materials.
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- Technical Physics, 2015, v. 60, n. 6, p. 922, doi. 10.1134/S1063784215060122
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Sensitive elements of vacuum sensors based on porous nanostructured SiO-SnO sol-gel films.
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- Technical Physics, 2015, v. 60, n. 6, p. 928, doi. 10.1134/S106378421506002X
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Intermittency of intermittencies at the phase synchronization boundary in the presence of noise.
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- Technical Physics, 2015, v. 60, n. 6, p. 933, doi. 10.1134/S1063784215060183
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Dependence of thermal expansion coefficient on size and shape of a silicon nanocrystal at various temperatures.
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- Technical Physics, 2015, v. 60, n. 6, p. 937, doi. 10.1134/S106378421506016X
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